ƒgƒbƒvbŠî–{î•ñbƒgƒsƒbƒNbƒXƒ^ƒbƒtbŒ¤‹†“à—ebŒ¤‹†‹ÆÑbŒ¤‹†Ý”õbŠˆ“®—ðŽjbu‹`bŒ¤‹†Žºb


”­•\˜_•¶ (Published Papers) 2004-Presentb1990-Presentb2004b2005b2006b2007b2008b2009b2010b2011b2012b2013b2014b2015b2016b2017b2018b2019b2020b2021b2022b2023b

‘Û‰ï‹c (International Conferences)b2005-Presentb2005b2006b2007b2008b2009b2010b2011b2012b2013b2014b2015b2016b2017b2018b2019b2020b2021b2022b2023b

‘“à‰ï‹c (Domestic Conferences)b2005-Presentb2005b2006b2007b2008b2009b2010b2011b2012b2013b2014b2015b2016b2017b2018b2019b2020b2021b2022b2023b

 

”­•\˜_•¶ (Published Papers)

2023”N“x (FY 2023)

D. Tsukayama, J. Shirakashi, and H. Imai

"CoolMomentum Mitigating Local Minima in Variational Quantum Eigensolvers"

Jpn. J. Appl. Phys. 62 (2023) 088003.

 

Y. Yoneda, M. Shimada, A. Yoshida, and J. Shirakashi

"Searching For Optimal Experimental Parameters with D-Wave Quantum Annealer for Fabrication of Au Atomic Junctions"

Appl. Phys. Express 16 (2023) 057001.

 

2022”N“x (FY 2022)

Y. Shimada, M. Shimada, T. Miki and J. Shirakashi

"Reservoir Computing-Based Real-Time Prediction for Quantized Conductance of Au Atomic Junctions"

Conference Proceedings, 2022 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), Digital Object Identifier: 10.1109/NMDC46933.2022.10052236, Publication Year: 28 February 2023, Page(s): 25-28.

 

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Experimental Evaluation of Performance Improvement by Sparse Operation in Ising Spin Computing"

Conference Proceedings, 2022 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), Digital Object Identifier: 10.1109/NMDC46933.2022.10052337, Publication Year: 28 February 2023, Page(s): 29-32.

 

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Efficient Ground-State Searches by Scheduling Sparsity of Interactions of Physical Spin Dynamics for Ising Spin Computing"

Conference Proceedings, 2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Digital Object Identifier: 10.1109/3M-NANO56083.2022.9941601, Publication Year: 16 November 2022, Page(s): 411-414.

 

T. Miki, D. Tsukayama, R. Okita, M. Shimada and J. Shirakashi

"Variational Parameter Optimization of Quantum-Classical Hybrid Heuristics on Near-term Quantum Computer"

Conference Proceedings, 2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Digital Object Identifier: 10.1109/3M-NANO56083.2022.9941666, Publication Year: 16 November 2022, Page(s): 415-418.

 

T. Miki, D. Tsukayama, R. Okita, M. Shimada and J. Shirakashi

"Quantum-Classical Variational Approaches with Single-Qubit Operation on Near-Term Quantum Processors"

Conference Proceedings, 2022 IEEE 22nd International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO54668.2022.9928623, Publication Year: 8 November 2022, Page(s): 303-306.

 

Scilight article written by Mara Johnson-Groh

"Artificial synapse network demonstrates plasticity behaviors"

21 SEPTEMBER 2022, https://doi.org/10.1063/10.0014401

Source: gMultiple connected artificial synapses based on electromigrated Au nanogaps,h by Keita Sakai, Mamiko Yagi, Mitsuki Ito, and Jun-ichi Shirakashi, Journal of Vacuum Science and Technology-B (2022). The article can be accessed at https://doi.org/10.1116/6.0002081.

This paper is part of the Neuromorphic Materials, Devices and Processing Collection.

Twitter: AIP Publishing

 

K. Sakai, M. Yagi, M. Ito and J. Shirakashi (Featured Article, also selected as Scilight)

"Multiple Connected Artificial Synapses Based on Electromigrated Au Nanogaps"

J. Vac. Sci. Technol. B 40 (2022) 053202.

Twitter: JVST A - JVST B

 

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Mimicking of Thermal Spin Dynamics by Controlling Sparsity of Interactions in Ising Spin Computing with Digital Logic Circuits"

Appl. Phys. Express 15 (2022) 067002.

 

2021”N“x (FY 2021)

T. Miki, R. Okita, M. Shimada, D. Tsukayama and J. Shirakashi

"Variational Ansatz Preparation to Avoid CNOT-Gates on Noisy Quantum Devices for Combinatorial Optimizations"

AIP Advances 12 (2022) 035247.

 

T. Miki, R. Okita, M. Shimada and J. Shirakashi

"Combinatorial Optimization with Variational Approaches on Noisy Quantum Devices"

Conference Proceedings, 2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Digital Object Identifier: 10.1109/3M-NANO49087.2021.9599740, Publication Year: 18 November 2021, Page(s): 214-217.

 

T. Miki, A. Yoshida, M. Shimada and J. Shirakashi

"Hybridization of Spin Decision Logics for Ising Machine with Logic Circuits"

Conference Proceedings, 2021 IEEE 21st International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO51122.2021.9514319, Publication Year: 26 August 2021, Page(s): 470-473.

 

K. Sakai, M. Yagi, M. Ito and J. Shirakashi

"Memory Properties of Electromigrated Au Nanogaps to Realize Reservoir Computing"

Appl. Phys. Lett. 119 (2021) 084101.

 

ŽO–ØŽiA“‡“c–GŠGA‰«“c—ÁA”’Š~~ˆê

g—ÊŽqŒvŽZ‹@‚ÉŽÀ‘•‚³‚ꂽ—ÊŽqEŒÃ“TƒnƒCƒuƒŠƒbƒhƒAƒ‹ƒSƒŠƒYƒ€‚É‚æ‚éŒÅ—L’l–â‘è‚Ì‹‰ðh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 121, no. 44, ED2021-8, pp. 31-34, 2021”N5ŒŽ.

i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB“dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDŒ¤j —ߘa3”N5ŒŽŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

 

‹g“c’©‹PAŽO–ØŽiA“‡“c–GŠGA•Ä“c—D—¢A”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éŒðŠ·‘ŠŒÝì—p‚̃Xƒp[ƒX‰»‚É‚æ‚éƒXƒsƒ“XVŽè–@h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 121, no. 44, ED2021-8, pp. 27-30, 2021”N5ŒŽ.

 

2020”N“x (FY 2020)

T. Miki, M. Shimada and J. Shirakashi

"Spin Connection Topology and Multi-Bit Spin Interaction Coefficients of Ising Spin Model with Digital Logic Gates"

Conference Proceedings, 2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (IEEE-DTS), Digital Object Identifier: 10.1109/DTS48731.2020.9196051, Publication Year: 15 September 2020, Page(s): 1-4.

 

Y. Iwata, T. Sakurai and J. Shirakashi (Featured Article)

"Machine Learning-Based Approach for Automatically Tuned Feedback-Controlled Electromigration"

AIP Advances 10 (2020) 065301.

 

K. Sakai, T. Sato, R. Kiyokawa, R. Koyama, M. Yagi, M. Ito and J. Shirakashi (STAP Article)

"Au Nanogap-Based Artificial Synapses"

Jpn. J. Appl. Phys. (STAP Article) 59 (2020) 050601.

 

2019”N“x (FY 2019)

T. Miki, M. Ito, Y. Hirata, Y. Kushitani, M. Shimada and J. Shirakashi

"Computational Properties of Ising Spin Model on Spin Connection Parameters"

Conference Proceedings, 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO46743.2019.8993915, Publication Year: 13 February 2020, Page(s): 121-124.

 

M. Shimada, M. Ito, Y. Hirata, Y. Kushitani, T. Miki and J. Shirakashi

"Calculation Behavior of 2D Ising Spin Computing with Different Spin Decision Logics"

Conference Proceedings, 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO46743.2019.8993941, Publication Year: 13 February 2020, Page(s): 345-348.

 

‹ù’J—DŠóA”’Š~~ˆê

g‘æ7Í Œ»ê‰Û‘è‰ðŒˆ‚ÉŒü‚¯‚½’ñˆÄ‹y‚Ñ“±“üŠˆ—p—áC‘æ10ß [‘wŠwK‚ð—p‚¢‚½¶‘Ìî•ñiŽèŽwŠÖßj‚Ì“®ì—\‘ªh

w‹@ŠBŠwK‚ð’†S‚Æ‚µ‚½ˆÙ팟’m‹Zp‚Ɖž—p’ñˆÄxiî•ñ‹@\j, pp.190-199, 2019”N11ŒŽ. (Book Chapter)

 

S. Sakai, Y. Hirata, M. Ito and J. Shirakashi

"Fabrication of Atomic Junctions with Experimental Parameters Optimized Using Ground-State Searches of Ising Spin Computing"

Sci. Rep. 9 (2019) 16211.

 

K. Sakai, T. Sato, S. Tani, M. Ito, M. Yagi and J. Shirakashi (Editor's Pick)

"Synaptic Behaviors of Electromigrated Au Nanogaps"

AIP Advances 9 (2019) 055317.

 

T. Kanokoda, Y. Kushitani, M. Shimada and J. Shirakashi

"Motion Prediction with Artificial Neural Networks Using Wearable Strain Sensors Based on Flexible Thin Graphite Films"

Key Eng. Mat. 826 (2019) 111-116.

 

ŽO–ØŽiAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóA•½“c‘é‰îA“‡“c–GŠGA”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒrƒbƒgŠÔŒ‹‡ƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 119, no. 34, ED2019-17, pp. 35-38, 2019”N5ŒŽ.

 

“‡“c–GŠGAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóA•½“c‘é‰îAŽO–ØŽiA”’Š~~ˆê

g2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒXƒsƒ“”»’è˜_—‚Ɖ‰ŽZ“Á«h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 119, no. 34, ED2019-18, pp. 39-42, 2019”N5ŒŽ.

 

ŸNˆä‘ñÆA’|—ÑŒh‘¾A•½“c‘é‰îA”’Š~~ˆê

gGA‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^i‰»Žè–@‚ÆAuŒ´ŽqÚ‡‚ÌŽ©“®Œ`¬h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 119, no. 34, ED2019-19, pp. 43-46, 2019”N5ŒŽ.

 

2018”N“x (FY 2018)

T. Kanokoda, Y. Kushitani, M. Shimada and J. Shirakashi

"Gesture Prediction Using Wearable Sensing Systems with Neural Networks for Temporal Data Analysis"

Sensors 19 (2019) 710.

 

M. Yagi and J. Shirakashi

"Quantifying Joule Heating and Mass Transport in Metal Nanowires during Controlled Electromigration"

Materials 12 (2019) 310.

 

M. Ito, M. Shimada, M. Yagi and J. Shirakashi

"Multiple-Junction Single-Electron Charging in Electromigrated Series-Connected Nanogaps Operating at Room Temperature"

Conference Proceedings, 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), Digital Object Identifier: 10.1109/NMDC.2018.8605737, Publication Year: 10 January 2019, Page(s): 1-4.

 

S. Tani, M. Ito, M. Yagi, M. Shimada, K. Sakai, K. Minami and J. Shirakashi

"Single-Electron Tunneling Effects in Electromigrated Coulomb Island between Au Nanogaps"

Conference Proceedings, 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), Digital Object Identifier: 10.1109/NMDC.2018.8605822, Publication Year: 10 January 2019, Page(s): 1-4.

 

M. Ito, M. Yagi, M. Shimada and J. Shirakashi

"Simultaneous Arrayed Formation of Single-Electron Transistors Using Electromigration in Series-Connected Nanogaps"

AIP Advances 8 (2018) 105005.

 

M. Hasumi, Y. Ogawa, K. Oshinari, J. Shirakashi, W. Kubo and T. Sameshima

"Reduction in Connecting Resistivity and Optical Reflection Loss at Intermediate Layer for Mechanically Stacked Multijunction Solar Cells"

Jpn. J. Appl. Phys. 57 (2018) 102301.

 

M. Ito, M. Yagi and J. Shirakashi

"Fabrication of Single-Electron Transistors with Electromigrated Ni Nanogaps"

AIP Advances 8 (2018) 075210.

 

M. Yagi and J. Shirakashi

"Local Joule Heating in Electromigrated Au Nanowires Imaged by In Situ Atomic Force Microscopy"

Conference Proceedings, 2017 12th IEEE Nanotechnology Materials and Devices Conference (NMDC), Digital Object Identifier: 10.1109/NMDC.2017.8350487, Publication Year: 30 April 2018, Page(s): 21-22.

 

2017”N“x (FY 2017)

Žðˆä³‘¾˜YAŠâ“c˜Ð”nA‰–‘º^KA–ØŒ´—T‰îA”’Š~~ˆê

gƒCƒWƒ“ƒOƒ}ƒVƒ“‚Å‚ÌŽÀŒ±ƒpƒ‰ƒ[ƒ^’Tõ‚ÆÅ“K‰»‚É‚æ‚éAuŒ´ŽqÚ‡‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œäh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 117, no. 453, ED2017-113(SDM2017-113), pp. 39-43, 2018”N2ŒŽ.

 

Šâ“c˜Ð”nAŽðˆä³‘¾˜YAÀ‘qŒ›•jA”’Š~~ˆê

glH’m”\‚É‚æ‚èŽx‰‡‚³‚ꂽAuŒ´ŽqÚ‡‚Ì컂Ɨʎqó‘Ô‚ÌŠÏ‘ªh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 117, no. 453, ED2017-114(SDM2017-114), pp. 45-50, 2018”N2ŒŽ.

 

T. Saito, Y. Kihara and J. Shirakashi

"Wearable Strain Sensors Based on Thin Graphite Films for Human Activity Monitoring"

J. Phys. Conf. Ser. 939 (2017) 012006.

 

S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi

"Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing"

Conference Proceedings, 2017 17th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2017.8117331, Publication Year: 23 November 2017, Page(s): 499-501.

 

Y. Kihara, M. Ito, T. Saito, M. Shiomura, S. Sakai and J. Shirakashi

"A New Computing Architecture Using Ising Spin Model Implemented on FPGA for Solving Combinatorial Optimization Problems"

Conference Proceedings, 2017 17th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2017.8117327, Publication Year: 23 November 2017, Page(s): 256-258.

 

M. Ito, M. Shiomura, T. Saito, Y. Kihara, S. Sakai and J. Shirakashi

"Prompt Decision Method for Ground-State Searches of Natural Computing Architecture Using 2D Ising Spin Model"

Conference Proceedings, 2017 17th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2017.8117326, Publication Year: 23 November 2017, Page(s): 581-583.

 

K. Inoue, M. Yagi, M. Ito, T. Ito and J. Shirakashi

"Investigation of Electromigration Induced by Field Emission Current Flowing through Au Nanogaps in Ambient Air"

J. Appl. Phys. 122 (2017) 084303.

 

M. Yagi and J. Shirakashi

"Evolution of Local Temperature in Au Nanowires during Feedback-Controlled Electromigration Observed by Atomic Force Microscopy"

Appl. Phys. Lett. 110 (2017) 203105.

 

2016”N“x (FY 2016)

–ØŒ´—T‰îAˆÉ“¡ŒõŽ÷AâV“¡F¬A‰–‘º^KAŽðˆä³‘¾˜YA”’Š~~ˆê

gŽ©‘RŽû‘©“®ì‚ð—˜—p‚µ‚½ƒCƒWƒ“ƒOƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‹Zp‚ÌŠJ”­‚ÆFPGA‚Ö‚ÌŽÀ‘•h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 116, no. 471, ED2016-134(SDM2016-151), pp. 23-28, 2017”N2ŒŽ.

 

‰–‘º^KAâV“¡F¬AˆÉ“¡ŒõŽ÷A–ØŒ´—T‰îAŽðˆä³‘¾˜YA”’Š~~ˆê

g˜_—ƒQ[ƒg‚Å•\Œ»‚³‚ꂽ2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚Ì‘g‡‚¹Å“K‰»–â‘è‚Ö‚Ì“K—ph

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 116, no. 471, ED2016-135(SDM2016-152), pp. 29-34, 2017”N2ŒŽ.

 

R. Suda, M. Yagi, A. Kojima, N. Mori, J. Shirakashi and N. Koshida

"Liquid-Phase Deposition of Thin Si and Ge Films Based on Ballistic Hot Electron Incidence"

Mat. Sci. Semicon. Proc. 70 (2017) 44-49.

 

2015”N“x (FY 2015)

Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi

"Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array"

Conference Proceedings, 2015 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO), Digital Object Identifier: 10.1109/3M-NANO.2015.7425485, Publication Year: 07 March 2016, Page(s): 198-201.

 

M. Kase, K. Okada M. Ito and J. Shirakashi

"Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors"

Conference Proceedings, 2015 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO), Digital Object Identifier: 10.1109/3M-NANO.2015.7425487, Publication Year: 07 March 2016, Page(s): 202-205.

 

R. Suda, M. Yagi, A. Kojima, N. Mori, J. Shirakashi and N. Koshida

"Reductive Deposition of Thin Cu Films Using Ballistic Hot Electrons as a Printing Beam"

J. Electrochem. Soc. 163 (2016) E162-E165.

 

N. Koshida, A. Kojima, N. Ikegami, R. Suda, M. Yagi, J. Shirakashi, H. Miyaguchi, M. Muroyama, S. Yoshida, K. Totsu and M. Esashi

"Development of Ballistic Hot Electron Emitter and Its Applications to Parallel Processing: Active-Matrix Massive Direct-Write Lithography in Vacuum and Thin-Film Deposition in Solutions"

J. Micro/Nanolith. MEMS MOEMS 14 (2015) 031215.

 

M. Yagi, T. Saito and J. Shirakashi

"In Situ Atomic Force Microscopy Imaging of Structural Changes in Metal Nanowires during Feedback-Controlled Electromigration"

J. Vac. Sci. Technol. B 33 (2015) 051806.

 

M. Ito, K. Morihara, T. Toyonaka, K. Takikawa and J. Shirakashi

"High-Throughput Nanogap Formation by Field-Emission-Induced Electromigration"

J. Vac. Sci. Technol. B 33 (2015) 051801.

 

T. Saito, H. Shimoda and J. Shirakashi

"Investigation of Strain Sensors Based on Thin Graphite Wires"

J. Vac. Sci. Technol. B 33 (2015) 042002.

 

M. Yagi, M. Ito and J. Shirakashi

"Structural Tuning of Nanogaps Using Electromigration Induced by Field Emission Current with Bipolar Biasing"

J. Appl. Phys. 118 (2015) 014306.

 

M. Ito, M. Yagi, K. Morihara and J. Shirakashi

"Simultaneous Fabrication of Nanogap Electrodes Using Field-Emission-Induced Electromigration"

J. Appl. Phys. 118 (2015) 014301.

 

2014”N“x (FY 2014)

M. Yagi, M. Ito and J. Shirakashi

"Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing"

Conference Proceedings, 2014 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO), Digital Object Identifier: 10.1109/3M-NANO.2014.7057332, Publication Year: 12 March 2015, Page(s): 134-138.

 

M. Ito, M. Yagi, K. Morihara and J. Shirakashi

"Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration"

Conference Proceedings, 2014 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO), Digital Object Identifier: 10.1109/3M-NANO.2014.7057331, Publication Year: 12 March 2015, Page(s): 312-315.

 

N. Koshida, A. Kojima, N. Ikegami, R. Suda, M. Yagi, J. Shirakashi, T. Yoshida, H. Miyaguchi, M. Muroyama, H. Nishino, S. Yoshida, M. Sugata, K. Totsu, M. Esashi

"Development of Ballistic Hot Electron Emitter and Its Applications to Parallel Processing: Active-Matrix Massive Direct-Write Lithography in Vacuum and Thin Films Deposition in Solutions"

Proc. SPIE Int. Soc. Opt. Eng. 9423 (2015) 7.

 

R. Suda, M. Yagi, A. Kojima, R. Mentek, N. Mori, J. Shirakashi and N. Koshida

"Deposition of Thin Si and Ge Films by Ballistic Hot Electron Reduction in a Solution-Dripping Mode and Its Application to the Growth of Thin SiGe Films"

Jpn. J. Appl. Phys. 54 (2015) 04DH11.

 

T. Toyonaka, K. Morihara, K. Takikawa, M. Ito and J. Shirakashi

"Controlling the Tunnel Resistance of Suspended Ni Nanogaps Using Field-Emission-Induced Electromigration"

J. Vac. Sci. Technol. B 33 (2015) 02B107.

 

Y. Kanamaru, M. Ando and J. Shirakashi

"Ultrafast Feedback-Controlled Electromigration Using a Field-Programmable Gate Array"

J. Vac. Sci. Technol. B 33 (2015) 02B106.

 

Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi

"A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA"

Conference Proceedings, 2014 14th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2014.6968058, Publication Year: 1 December 2014, Page(s): 719-722.

 

K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi

"Resistive Switching Effects in Electromigrated Ni Nanogaps"

Conference Proceedings, 2014 14th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2014.6968014, Publication Year: 1 December 2014, Page(s): 715-718.

 

N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori and J. Shirakashi

"Low-Temperature Deposition of Thin Si, Ge, and SiGe Films Using Reducing Activity of Ballistic Hot Electrons"

ECS Trans. 64 (2014) 405-410.

 

N. Koshida, N. Ikegami, A. Kojima, R. Mentek, R. Suda, M. Yagi, J. Shirakashi, B. Gelloz and N. Mori (Invited)

"Ballistic Hot Electron Effects in Nanosilicon Dots and Their Photonic Applications"

ECS Trans. 61 (2014) 47-54.

 

2013”N“x (FY 2013)

R. Suda, S. Akimoto, K. Morihara and J. Shirakashi

"Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

Conference Proceedings, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2013.6720862, Publication Year: 27 January 2014, Page(s): 87-90.

 

T. Saito, R. Suda and J. Shirakashi

"In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System"

Conference Proceedings, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2013.6720865, Publication Year: 27 January 2014, Page(s): 717-721.

 

M. Ando, S. Akimoto, R. Suda and J. Shirakashi

"Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme"

Conference Proceedings, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2013.6721060, Publication Year: 27 January 2014, Page(s): 1141-1144.

 

N. Koshida, A. Kojima, T. Ohta, R. Mentek, B. Gelloz, N. Mori and J. Shirakashi

"Electro-Deposition of Thin Si and Ge Films Based on Ballistic Hot Electron Injection"

ECS Solid State Lett. 3 (2014) P57-P60.

 

ˆÀ“¡¹ŸA‹àŠÛ—S^AâV“¡F¬A”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚É‚æ‚鎞ŠÔŠm’èŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“§ŒäƒVƒXƒeƒ€h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 113, no. 449, ED2013-146(SDM2013-161), pp. 77-82, 2014”N2ŒŽ.

 

‹àŠÛ—S^AˆÀ“¡¹ŸAâV“¡F¬A”’Š~~ˆê

gFPGA‚ð—p‚¢‚½’´‚‘¬ƒtƒB[ƒhƒoƒbƒN§ŒäŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 113, no. 449, ED2013-147(SDM2013-162), pp. 83-87, 2014”N2ŒŽ.

 

{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AXŒ´N•½A–L’†‹M‘åA‘êìŽåŠìA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚Å‚ÌŒ´Žq‚̃}ƒCƒOƒŒ[ƒVƒ‡ƒ“Œ»Û‚É‚æ‚è컂µ‚½NiŒnƒiƒmƒXƒP[ƒ‹ƒfƒoƒCƒXh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 113, no. 449, ED2013-149(SDM2013-164), pp. 95-100, 2014”N2ŒŽ.

 

T. Saito, W. Lin and J. Shirakashi

"In-Situ Observation of Temperature Distribution of Microheaters Using Near-Infrared Charge Coupled Device Imaging System"

Nanosci. Nanotechnol. Lett. 5 (2013) 1076-1080.

 

M. Ito, S. Akimoto, R. Suda and J. Shirakashi

"Chapter 13: Simultaneously Controlled Tuning of Tunneling Properties of Integrated Nanogaps Using Field-Emission-Induced Electromigration"

Nanoelectronic Device Applications Handbook, Edited by James E. Morris & Krzysztof Iniewski, CRC Press, Taylor and Francis Group, LLC, pp.167-179, 2013. (Book Chapter)

 

2012”N“x (FY 2012)

R. Suda, M. Yagi, T. Watanabe and J. Shirakashi

"Formation Scheme of Quantum Point Contacts Based on Nanogaps Using Field-Emission-Induced Electromigration"

J. Nanosci. Nanotechnol. 13 (2013) 883-887.

 

S. Akimoto, M. Ito, S. Ueno and J. Shirakashi

"Control Parameters for Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

J. Nanosci. Nanotechnol. 13 (2013) 993-996.

 

{“c—²‘¾˜YAâV“¡F¬A‹g“c‘ìAAmpere A. TsengA”’Š~~ˆê

gSPMƒXƒNƒ‰ƒbƒ`–@‚ð—p‚¢‚½ƒiƒmƒXƒP[ƒ‹‰ÁH‚̃Oƒ‰ƒtƒFƒ“‚Ö‚Ì“K—ph

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 112, no. 445, ED2012-141(SDM2012-170), pp. 71-76, 2013”N2ŒŽ.

 

âV“¡F¬AŒú•ê‘§A{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒWƒ…[ƒ‹‰Á”M‚³‚ꂽƒOƒ‰ƒtƒFƒ“‚Ì‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚é‚»‚Ìꉷ“x‘ª’èh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 112, no. 445, ED2012-142(SDM2012-171), pp. 77-82, 2013”N2ŒŽ.

 

S. Akimoto, R. Suda, M. Ito, M. Ando and J. Shirakashi

"Conduction Mechanism of Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

Conference Proceedings, 2013 IEEE 5th International Nanoelectronics Conference (IEEE-INEC), Digital Object Identifier: 10.1109/INEC.2013.6466001, Publication Year: 21 February 2013, Page(s): 211-214.

 

R. Suda, T. Saito, A. A. Tseng and J. Shirakashi

"Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy"

Conference Proceedings, 2013 IEEE 5th International Nanoelectronics Conference (IEEE-INEC), Digital Object Identifier: 10.1109/INEC.2013.6466024, Publication Year: 21 February 2013, Page(s): 285-287.

 

T. Saito, W. Lin, I. Atsumo and J. Shirakashi

"In-Situ Observation of Temperature Distribution of Microheaters Using Near-Infrared CCD Imaging System"

Conference Proceedings, 2013 IEEE 5th International Nanoelectronics Conference (IEEE-INEC), Digital Object Identifier: 10.1109/INEC.2013.6466079, Publication Year: 21 February 2013, Page(s): 466-469.

 

R. Suda, T. Ohyama, A. A. Tseng and J. Shirakashi (Invited)

"In-Situ Control of Quantum Point Contacts Using Scanning Probe Microscopy Scratch Lithography"

Conference Proceedings, 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2012.6321908, Publication Year: 4 October 2012, Page(s): 1-5.

 

X. Jiang, G. Wu, Z. Du, K. J. Ma, J. Shirakashi and A. A. Tseng

"Nanoscale Scratching of Platinum Thin Films Using Atomic Force Microscopy with DLC Tips"

J. Vac. Sci. Technol. B 30 (2012) 021605.

 

2011”N“x (FY 2011)

M. Ito, S. Ueno, T. Watanabe, S. Akimoto and J. Shirakashi (Invited)

"Simultaneous Tuning of Tunnel Resistance of Integrated Nanogaps by Field-Emission-Induced Electromigration"

Conference Proceedings, 2011 11th IEEE International Conference on Nanotechnology (IEEE-NANO), Digital Object Identifier: 10.1109/NANO.2011.6144515, Publication Year: 2 February 2012, Page(s): 260-263.

 

{“c—²‘¾˜YA‘åŽR—²GA”’Š~~ˆê

gSPMƒXƒNƒ‰ƒbƒ`‰ÁH‚ð—p‚¢‚½‹à‘®ƒ`ƒƒƒlƒ‹‹·ó‰ß’ö‚É‚¨‚¯‚éƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚Ì—ÊŽq‰»h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 111, no. 425, ED2011-150(SDM2011-167), pp. 47-52, 2012”N2ŒŽ.

i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB •½¬24”N“dŽqƒfƒoƒCƒXŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

 

ˆÉ“¡ŒõŽ÷AHŒ³r‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚ð—p‚¢‚½’¼—ñŒ^ƒiƒmƒMƒƒƒbƒv‚ÌWω»‚Æ“Á«§Œäh

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 111, no. 425, ED2011-151(SDM2011-168), pp. 53-58, 2012”N2ŒŽ.

 

S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi

"Field-Emission-Induced Electromigration Method for The Integration of Single-Electron Transistors"

Appl. Surf. Sci. 258 (2012) 2153-2156.

 

K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi

"A Newly Investigated Approach for The Control of Tunnel Resistance of Nanogaps Using Field-Emission-Induced Electromigration"

Appl. Surf. Sci. 258 (2012) 2029-2033.

 

S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi

"Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

J. Nanosci. Nanotechnol. 11 (2011) 6258-6261.

 

K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi

"Tuning of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration Using Current Source Mode"

J. Nanosci. Nanotechnol. 11 (2011) 6266-6270.

 

T. Watanabe, K. Takiya and J. Shirakashi

"Fabrication of Planar-Type Ni/Vacuum/Ni Tunnel Junctions Based on Ferromagnetic Nanogaps Using Field-Emission-Induced Electromigration"

J. Appl. Phys. 109 (2011) 07C919.

 

A. A. Tseng, C. J. Kuo, S. Jou, S. Nishimura and J. Shirakashi

"Scratch Direction and Threshold Force in Nanoscale Scratching Using Atomic Force Microscopes"

Appl. Surf. Sci. 257 (2011) 9243-9250.

 

2010”N“x (FY 2010)

Y. Kuwabara, S. Nishimura, R. Zaharuddin and J. Shirakashi

"Investigation of Electromigration in Micrometer-Scale Metal Wires by In-Situ Optical Microscopy"

Conference Proceedings, 2011 IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS), Digital Object Identifier: 10.1109/NEMS.2011.6017446, Publication Year: 12 September 2011, Page(s): 681-684.

 

ˆÀ•—´‘¾˜NA“n糌h“oAã–ìr‰îA–kìA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚ð—p‚¢‚½Žº‰·“®ì‰Â”\‚ȃvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‘fŽq‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 110, no. 423, ED2010-195(SDM2010-230), pp. 19-23, 2011”N2ŒŽ.

 

W. Kume, Y. Tomoda, M. Hanada and J. Shirakashi

"Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

J. Nanosci. Nanotechnol. 10 (2010) 7239-7243.

 

S. Itami, Y. Tomoda, R. Yasutake and J. Shirakashi

"Influence of Feedback Parameters on Resistance Control of Metal Nanowires by Stepwise Feedback-Controlled Electromigration"

J. Nanosci. Nanotechnol. 10 (2010) 7464-7468.

 

J. Shirakashi (Invited)

"Scanning Probe Microscope Lithography at the Micro- and Nano-Scales"

J. Nanosci. Nanotechnol. 10 (2010) 4486-4494.

 

T. Toyofuku, S. Nishimura, K. Miyashita and J. Shirakashi

"10 Micrometer-Scale SPM Local Oxidation Lithography"

J. Nanosci. Nanotechnol. 10 (2010) 4543-4547.

 

A. A. Tseng, L. Pellegrino and J. Shirakashi

"Chapter-287: Nanofabrication Using Atomic Force Microscopy"

Encyclopedia of Nanoscience and Nanotechnology, Edited by Hari Singh Nalwa, American Scientific Publishers, June 2010. (Book Chapter)

 

”’Š~~ˆê

g‘æ5̓vƒƒZƒX‹ZpC‘æ2߃iƒmƒVƒŠƒRƒ“\‘¢Œ`¬SPM‹Zph

wƒiƒmƒVƒŠƒRƒ“‚ÌÅV‹Zp‚Ɖž—p“WŠJxi‰z“cM‹`ŠÄCAƒV[ƒGƒ€ƒV[o”Åj, pp.222-235, 2010”N6ŒŽ. (Book Chapter)

 

2009”N“x (FY 2009)

ã–ìr‰îA—F“c—I‰îA‹v•Äœ\A‰Ô“c“¹—fA‘ê’J˜a‘A”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚ÌWω»h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 109, no. 422, ED2009-202(SDM2009-199), pp. 35-39, 2010”N2ŒŽ.

i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB •½¬22”N“dŽqƒfƒoƒCƒXŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

 

‘ê’J˜a‘A—F“c—I‰îA“n糌h“oA‹v•Äœ\Aã–ìr‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚É‚æ‚éƒvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 109, no. 422, ED2009-203(SDM2009-200), pp. 41-45, 2010”N2ŒŽ.

 

Y. Tomoda, M. Hanada, W. Kume, S. Itami, T. Watanabe and J. Shirakashi

"Fabrication of Planar-Type Ferromagnetic Tunnel Junctions Using Electromigration Method and Its Magnetoresistance Properties"

J. Phys. Conf. Ser. 200 (2010) 062035.

 

A. A. Tseng, J. Shirakashi, S. Jou, J. C. Huang and T. P. Chen

"Scratch Properties of Nickel Thin Films Using Atomic Force Microscopy"

J. Vac. Sci. Technol. B 28 (2010) 202-210.

 

A. A. Tseng, J. Shirakashi, S. Nishimura, K. Miyashita and Z. Li

"Nanomachining of Permalloy for Fabricating Nanoscale Ferromagnetic Structures Using Atomic Force Microscopy"

J. Nanosci. Nanotechnol. 10 (2010) 456-466.

 

A. A. Tseng, J. Shirakashi, S. Nishimura, K. Miyashita and A. Notargiacomo

"Scratching Properties of Nickel-Iron Thin Film and Silicon Using Atomic Force Microscopy"

J. Appl. Phys. 106 (2009) 044314.

 

Y. Tomoda, K. Takahashi, M. Hanada, W. Kume, S. Itami, T. Watanabe and J. Shirakashi

"Magnetoresistance Properties of Planar-Type Tunnel Junctions with Ferromagnetic Nanogap System Fabricated by Electromigration Method"

IEEE Trans. Mag. 45 (2009) 3480-3483.

 

2008”N“x (FY 2008)

—F“c—I‰îA‹v•Äœ\A‰Ô“c“¹—fA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï‹ZpŒ¤‹†•ñ, vol. 108, no. 437, ED2008-232(SDM2008-224), pp. 47-52, 2009”N2ŒŽ.

 

Y. Tomoda, K. Takahashi, M. Hanada, W. Kume and J. Shirakashi

"Fabrication of Nanogap Electrodes by Field-Emission-Induced Electromigration"

J. Vac. Sci. Technol. B 27 (2009) 813-816.

 

S. Nishimura, T. Toyofuku, K. Miyashita, Y. Takemura and J. Shirakashi

"Improvement of SPM Local Oxidation Nanolithography"

J. Vac. Sci. Technol. B 27 (2009) 948-952.

 

K. Takahashi, Y. Tomoda, S. Itami and J. Shirakashi

"Control of Channel Resistance on Metal Nanowires by Electromigration Patterning Method"

J. Vac. Sci. Technol. B 27 (2009) 805-809.

(Selected for the April 13, 2009 Issue of Virtual Journal of Nanoscale Science & Technology.)

 

K. Miyashita, S. Nishimura, T. Toyofuku and J. Shirakashi

"Nanoscale Patterning of NiFe Surface by SPM Scratch Nanolithography"

J. Vac. Sci. Technol. B 27 (2009) 953-957.

 

N. Ishii, T. Yokoyama, H. Shibata, T. Yamada, J. Shirakashi and Y. Takemura

"Magnetization Switching of Magnetic Submicron Structure Fabricated by Atomic Force Microscope"

IEEJ Trans. 3 (2008) 386-389.

 

S. Hasegawa, S. Yamada, T. Yamada, J. Shirakashi and Y. Takemura

"AFM Nano-Oxidation of NiFe Thin Films Capped with Al-Oxide Layers for Planar-Type Tunnel Junction"

IEEJ Trans. 3 (2008) 382-385.

 

2007”N“x (FY 2007)

S. Kayashima, K. Takahashi, M. Motoyama and J. Shirakashi

"Wide-Range Control of Tunnel Resistance on Metallic Nanogaps Using Migration"

J. Phys. Conf. Ser. 100 (2008) 052022.

 

S. Nishimura, T. Ogino, Y. Takemura and J. Shirakashi

"Tapping Mode SPM Local Oxidation Nanolithography with Sub-10 nm Resolution"

J. Phys. Conf. Ser. 100 (2008) 052021.

 

T. Ogino, S. Nishimura and J. Shirakashi

"Nanoscale Patterning of Si Surface Using SPM Scratching"

J. Phys. Conf. Ser. 100 (2008) 052020.

 

S. Nishimura, T. Ogino, Y. Takemura and J. Shirakashi

"Local Oxidation of Si Surfaces by Tapping-Mode Scanning Probe Microscopy: Size Dependence of Oxide Wires on Dynamic Properties of Cantilever"

Jpn. J. Appl. Phys. 47 (2008) 718-720.

 

S. Nishimura, T. Ogino and J. Shirakashi

"Micrometer-Scale Local-Oxidation Lithography Using Scanning Probe Microscopy"

Jpn. J. Appl. Phys. 47 (2008) 715-717.

 

T. Ogino, S. Nishimura and J. Shirakashi

"Scratch Nanolithography on Si Surface Using Scanning Probe Microscopy: Influence of Scanning Parameters on Groove Size"

Jpn. J. Appl. Phys. 47 (2008) 712-714.

 

Y. Shimada, T. Yamada, J. Shirakashi and Y. Takemura

"Measurement of Reaction Current during Atomic Force Microscope Local Oxidation of Conductive Surfaces Capped with Insulating Layers"

Jpn. J. Appl. Phys. 47 (2008) 768-770.

 

S. Kayashima, K. Takahashi, M. Motoyama and J. Shirakashi

"Control of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration"

Jpn. J. Appl. Phys. 46 (2007) L907-L909.

 

T. Ogino, S. Nishimura and J. Shirakashi

"Sub-20 nm Scratch Nanolithography for Si Using Scanning Probe Microscopy"

Jpn. J. Appl. Phys. 46 (2007) 6908-6910.

 

S. Nishimura, Y. Takemura and J. Shirakashi

"SPM Local Oxidation Nanolithography with Active Control of Cantilever Dynamics"

J. Phys. Conf. Ser. 61 (2007) 1066-1070.

 

Y. Takemura, Y. Shimada, G. Watanabe, T. Yamada and J. Shirakashi

"Measurement of Faradaic Current during AFM Local Oxidation of Magnetic Metal Thin Films"

J. Phys. Conf. Ser. 61 (2007) 1147-1151.

 

2006”N“x (FY 2006)

Y. Tomoda, S. Kayashima, T. Ogino, M. Motoyama, Y. Takemura and J. Shirakashi

"Planar-Type Ferromagnetic Tunnel Junctions Fabricated by SPM Local Oxidation"

J. Magn. Magn. Mat. 310 (2007) e641-e643.

 

Y. Tomoda, Y. Shibata, J. Shirakashi and Y. Takemura

"Magnetoresistance Effect of Planar-Type Ferromagnetic Tunnel Junctions"

J. Appl. Phys. 99 (2006) 08T312.

(Selected for the May 8, 2006 Issue of Virtual Journal of Nanoscale Science & Technology.)

 

Y. Takemura and J. Shirakashi (Invited)

"AFM Lithography for Fabrication of Magnetic Nanostructures and Devices"

J. Magn. Magn. Mat. 304 (2006) 19-22.

 

2005”N“x (FY 2005)

G. Watanabe, S. Koizumi, T. Yamada, Y. Takemura and J. Shirakashi

"Magnetoresistance of Patterned NiFe Thin Films with Structures Modified by Atomic Force Microscope Nanolithography"

J. Vac. Sci. & Technol. B 23 (2005) 2390-2393.

 

Y. Takemura and J. Shirakashi

"Modification of Electrical Properties and Magnetic Domain Structures in Magnetic Nanostructures by AFM Nano-Lithography"

Adv. Eng. Mat. 7 (2005) 170-173.

 

Y. Takemura, S. Hayashi, F. Okazaki, T. Yamada and J. Shirakashi

"Direct Modification of Magnetic Domains in Co Nanostructures by Atomic Force Microscope Lithography"

Jpn. J. Appl. Phys. 44 (2005) L285-L287.

 

2004”N“x (FY 2004)

J. Shirakashi and Y. Takemura

"Ferromagnetic Ultra-Small Tunnel Junction Devices Fabricated by Scanning Probe Microscope (SPM) Local Oxidation"

IEEE Trans. Mag. 40 (2004) 2640-2642.

 

J. Shirakashi and Y. Takemura

"SPM Fabrication of Nanometerscale Ferromagnetic Metal-Oxide Devices"

J. Magn. Magn. Mat. 272-276P2 (2004) 1581-1583.

 

Y. Takemura and J. Shirakashi (Invited)

"Fabrication of Magnetic Nanostructures and Devices by AFM Nano-Lithography Technique"

Proc. SPIE Int. Soc. Opt. Eng. 5774 (2004) 17-22.

 

K. Watanabe, Y. Takemura, Y. Shimazu and J. Shirakashi

"Magnetic Nanostructures Fabricated by the Atomic Force Microscopy Nano-Lithography Technique"

Nanotechnology 15 (2004) S566-S569.

 

M. B. A. Jalil, C. W. Kim, Y. Takemura and J. Shirakashi

"Finite-Element Capacitance Calculation and Spin-Dependent Transport Modeling of Double Magnetic Tunnel Junctions"

Transactions of the Magnetics Society of Japan, Vol. 4, No. 1, (2004) 28-33.

 

‘Û‰ï‹c (International Conferences)

2023”N“x (FY 2023)

J. Artag, M. Shimada and J. Shirakashi

"Parallel Quantum Annealing: A Novel Approach to Solving Multiple NP-Hard Problems Concurrently"

IEEE International Conference on Quantum Computing and Engineering (QCE23), September 17-22, 2023, Bellevue, Washington, USA.

 

2022”N“x (FY 2022)

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Experimental Evaluation of Performance Improvement by Sparse Operation in Ising Spin Computing"

17th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2022), November 18-20, 2022, Nanjing, China. (in Combination with Online Conference)

 

Y. Shimada, M. Shimada, T. Miki and J. Shirakashi

"Reservoir Computing-Based Real-Time Prediction for Quantized Conductance of Au Atomic Junctions"

17th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2022), November 18-20, 2022, Nanjing, China. (in Combination with Online Conference)

 

T. Miki, D. Tsukayama, R. Okita, M, Shimada and J. Shirakashi

"Variational Parameter Optimization of Quantum-Classical Hybrid Heuristics on Near-Term Quantum Computer"

2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2022), August 8-12, 2022, Tianjin, China. (in Combination with Online Conference)

 

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Efficient Ground-State Searches by Scheduling Sparsity of Interactions of Physical Spin Dynamics for Ising Spin Computing"

2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2022), August 8-12, 2022, Tianjin, China. (in Combination with Online Conference)

 

T. Miki, D. Tsukayama, R. Okita, M, Shimada and J. Shirakashi

"Quantum-Classical Variational Approaches with Single-Qubit Operation on Near-Term Quantum Processors"

22nd IEEE International Conference on Nanotechnology (IEEE NANO 2022), July 4-8, 2022, Majorca, Spain.

 

2021”N“x (FY 2021)

K. Sakai and J. Shirakashi (Invited)

"Application of Electromigrated Au Nanogaps to Artificial Synaptic Devices and Physical Reservoir Computing"

2021 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2021), August 26-27, 2021, Virtual. (Online Conference)

 

T. Miki, R. Okita, M. Shimada and J. Shirakashi

"Combinatorial Optimization with Variational Approaches on Noisy Quantum Devices"

2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2021), August 2-6, 2021, Xi'an, China. (Online Conference)

 

T. Miki, A. Yoshida, M. Shimada and J. Shirakashi

"Hybridization of Spin Decision Logics for Ising Machine with Logic Circuits"

21st IEEE International Conference on Nanotechnology (IEEE NANO 2021), July 28-31, 2021, Virtual Format. (Online Conference)

 

T. Miki, M. Shimada and J. Shirakashi

"Ground State Searches with Ising Spin Models Using Hybrid-Type Spin Decision Logics"

2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)

 

M. Shimada, T. Miki and J. Shirakashi

"Simulated Quantum Annealing for Solving Combinatorial Optimization Problems with 2D Ising Machines"

2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)

 

A. Yoshida, T. Miki, M. Shimada, Y. Yoneda and J. Shirakashi

"Sparsifying Connected Spins in Majority Voting Method of Ising Spin Computing Based on Logic Gates"

2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)

 

Y. Yoneda, M. Shimada, T. Miki and J. Shirakashi

"Calculation Properties of Quantum Annealing Machines with Chimera and Pegasus Topologies"

2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)

 

T. Ooka, T. Miki and J. Shirakashi

"Prediction of Quantized Conductance in Au Atomic Junctions Using Reservoir Computing"

2021 International Conference on Nanoscience & Technology (ICN+T 2021), July 12-15, 2021, Virtual Event. (Online Conference)

 

2020”N“x (FY 2020)

K. Sakai, T. Miki, R. Kiyokawa, R. Koyama, K. Watanabe and J. Shirakashi

"Information Processing Using Reservoir Computing with Dynamical Node of Electromigrated Au Nanogaps"

2020 International Symposium on Nonlinear Theory and Its Applications (NOLTA2020), November 16-19, 2020, Okinawa, Japan. (Online Conference)

 

T. Miki, M. Shimada and J. Shirakashi

"Spin Connection Topology and Multi-Bit Spin Interaction Coefficients of Ising Spin Model with Digital Logic Gates"

2020 IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (IEEE DTS), June 7-10, 2020, Hammamet, Tunisia. (Online Conference)

 

2019”N“x (FY 2019)

T. Miki, M. Ito, Y. Hirata, Y. Kushitani, M. Shimada and J. Shirakashi

"Computational Properties of Ising Spin Model on Spin Connection Parameters"

19th IEEE International Conference on Nanotechnology (IEEE NANO 2019), July 22-26, 2019, Macao, China.

 

M. Shimada, M. Ito, Y. Hirata, Y. Kushitani, T. Miki and J. Shirakashi

"Calculation Behavior of 2D Ising Spin Computing with Different Spin Decision Logics"

19th IEEE International Conference on Nanotechnology (IEEE NANO 2019), July 22-26, 2019, Macao, China.

 

T. Sato, K. Sakai, K. Minami, S. Tani, M. Ito, M. Yagi and J. Shirakashi

"Synaptic Learning Behavior of Multiple-Connected Au Nanogaps Using Electromigration"

3rd International Conference on Applied Surface Science (ICASS 2019), June 17-20, 2019, Pisa, Italy.

 

2018”N“x (FY 2018)

K. Sakai, K. Minami, S. Tani, T. Sato, M. Ito, M. Yagi and J. Shirakashi

"Synaptic Plasticity and Learning Behaviors Mimicked in Electromigrated Au Nanogaps"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018), December 2-6, 2018, Waikoloa, HI, USA.

 

T. Sakurai, Y. Hirata, K. Takebayashi, Y. Iwata and J. Shirakashi

"Fabrication of Au Atomic Junctions Using Artificial Intelligence Implemented on FPGA"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018), December 2-6, 2018, Waikoloa, HI, USA.

 

K. Minami, S. Tani, K. Sakai, T. Sato, M. Ito, M. Yagi and J. Shirakashi

"Electromigration-Induced Structural Modification of Series-Parallel-Connected Au Nanogaps"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2018), December 2-6, 2018, Waikoloa, HI, USA.

 

M. Ito, M. Yagi, M. Shimada and J. Shirakashi

"Multiple-Junction Single-Electron Charging in Electromigrated Series-Connected Nanogaps Operating at Room Temperature"

13th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2018), October 14-17, 2018, Portland, OR, USA.

 

S. Tani, M. Ito, M. Yagi, M. Shimada, K. Sakai, K. Minami and J. Shirakashi

"Single-Electron Tunneling Effects in Electromigrated Coulomb Island between Au Nanogaps"

13th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2018), October 14-17, 2018, Portland, OR, USA.

 

T. Kanokoda, Y. Kushitani, M. Shimada and J. Shirakashi

"Hand Motion Prediction by Neural Networks Using Wearable Strain Sensors Based on Thin Graphite Films"

7th International Conference on Materials and Applications for Sensors and Transducers (IC-MAST 2018), September 24-27, 2018, Bratislava, Slovakia.

 

2017”N“x (FY 2017)

M. Yagi and J. Shirakashi

"Local Joule Heating in Electromigrated Au Nanowires Imaged by In Situ Atomic Force Microscopy"

12th IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2017), October 2-4, 2017, Singapore.

 

Y. Kihara, M. Ito, T. Saito, M. Shiomura, S. Sakai and J. Shirakashi

"A New Computing Architecture Using Ising Spin Model Implemented on FPGA for Solving Combinatorial Optimization Problems"

17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.

 

S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi (Invited)

"Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing"

17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.

 

M. Ito, M. Shiomura, T. Saito, Y. Kihara, S. Sakai and J. Shirakashi

"Prompt Decision Method for Ground-State Searches of Natural Computing Architecture Using 2D Ising Spin Model"

17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.

 

M. Ito, K. Okada, K. Inoue, T. Ito and J. Shirakashi

"Arrayed Formation of Single-Electron Transistors Based on Electromigration in Series-Connected Nanogaps"

2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.

 

Y. Iwata, Y. Katogi, N. Numakura, S. Sakai and J. Shirakashi

"Intelligent Control Approach of Quantized Conductance of Au Atomic Junctions Formed by Feedback-Controlled Electromigration"

2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.

 

K. Minami, M. Ito, S. Tani and J. Shirakashi

"Electrical Properties of Series-Parallel-Connected Au Nanogaps during Electromigration-Based Current Biasing Method"

2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.

 

S. Tani, M. Ito, K. Minami and J. Shirakashi

"Single-Electron Transistors with Electromigrated Au Nanogaps"

2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.

 

2016”N“x (FY 2016)

T. Saito, Y. Kihara and J. Shirakashi

"Monitoring Human Physiological Signals Using Artificial Flexible Graphite Thin Films"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016), December 11-15, 2016, Hawaii, USA.

 

N. Numakura, Y. Iwata and J. Shirakashi

"Feedback-Controlled Electromigration (FCE) Method with Automatically Optimized Parameters"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016), December 11-15, 2016, Hawaii, USA.

 

K. Inoue, T. Ito and J. Shirakashi

"Investigation of Electromigration Induced by Field Emission Current Flowing through Au Nanogaps in Ambient Air"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016), December 11-15, 2016, Hawaii, USA.

 

T. Ito, K. Inoue and J. Shirakashi

"Structural and Electrical Properties of Electromigrated Au Nanogaps"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016), December 11-15, 2016, Hawaii, USA.

 

T. Saito, Y. Kihara and J. Shirakashi

"Wearable Strain Sensors Based on Thin Graphite Films for Human Activity Monitoring"

6th International Conference on Materials and Applications for Sensors and Transducers (IC-MAST 2016), September 27-30, 2016, Athens, Greece.

 

R. Suda, M. Yagi, A. Kojima, N. Mori, J. Shirakashi and N. Koshida

"Criterion for Ballistic-electron Printing of Thin Metal and Group IV Films"

2016 International Conference on Solid State Devices and Materials (SSDM 2016), September 26-29, 2016, Tsukuba, Japan.

 

M. Ito, K. Okada, K. Inoue, T. Ito and J. Shirakashi

"Formation of Single-Electron Transistor Arrays by Field-Emission-Induced Electromigration"

32nd European Conference on Surface Science (ECOSS 32), August 28 - September 2, 2016, Grenoble, France.

 

R. Suda, M. Yagi, A. Kojima, N. Mori, J. Shirakashi and N. Koshida

"Liquid-Phase Deposition of Thin Si and Ge Films Based on Ballistic Hot Electron Printing"

7th International Symposium on Control of Semiconductor Interfaces (ISCSI-VII), June 7-11, 2016, Nagoya, Japan.

 

J. Shirakashi (Solicited)

"Controlled Electromigration Method for the Fabrication of Nanoscale Junction Devices"

Emerging Technologies 2016, Hotel Bonaventure Montreal, May 25-27, 2016, Montreal, QC, Canada.

 

2015”N“x (FY 2015)

R. Suda, M. Yagi, A. Kojima, J. Shirakashi and N. Koshida

"Thin Cu Film Deposition under Incidence of Ballistic Hot Electrons Emitted from Nanocrystalline Porous Silicon Diode"

International Conference on Porous Semiconductors Science and Technology 2016 (PSST 2016), March 6-11, 2016, Tarragona, Spain.

 

S. Sato, Y. Kanamaru, Y. Katogi and J. Shirakashi

"Time-Deterministic Control of Quantized Conductance of Au Nanowires Using Feedback-Controlled Electromigration with Real-Time Operating System"

43rd International Conference on the Physics and Chemistry of Surfaces and Interfaces (PCSI-43), January 17-21, 2016, Palm Springs, CA, USA.

 

Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi

"Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array"

5th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2015), October 5-9, 2015, Changchun, China.

 

M. Ito, M. Kase, K. Okada and J. Shirakashi

"Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors"

5th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2015), October 5-9, 2015, Changchun, China.

 

Y. Katogi, Y. Kanamaru, S. Sato and J. Shirakashi

"Channel Conductance of Au Nanowires Tuned by Ultrafast Electromigration Using a Field-Programmable Gate Array"

10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015), September 13-16, 2015, Manchester, UK.

 

M. Kase, K. Okada, K. Morihara and J. Shirakashi

"Precise Tuning of Electrical Properties of Nanogap-Based Single-Electron Transistors Using Field-Emission-Induced Electromigration Method"

10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015), September 13-16, 2015, Manchester, UK.

 

2014”N“x (FY 2014)

N. Koshida, A. Kojima, N. Ikegami, R. Suda, M. Yagi, J. Shirakashi, H. Miyaguchi, M. Muroyama, S. Yoshida, K. Totsu, and M. Esashi

"Development of Ballistic Hot Electron Emitter and Its Applications to Parallel Processing: Active-Matrix Massive Direct-Write Lithography in Vacuum and Thin Films Deposition in Solutions"

SPIE Advanced Lithography. International Society for Optics and Photonics 2015, February 22-26, 2015, California, USA.

 

M. Yagi, T. Saito and J. Shirakashi

"In-Situ AFM Imaging of Structural Change in Metal Nanowires during Feedback-Controlled Electromigration"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014), December 7-11, 2014, Hawaii, USA.

 

M. Ito, K. Morihara, T. Toyonaka, K. Takikawa and J. Shirakashi

"High-Throughput Nanogap Formation by Field-Emission-Induced Electromigration"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014), December 7-11, 2014, Hawaii, USA.

 

T. Saito, M. Matayoshi and J. Shirakashi

"Investigation of Strain Sensors Based on Thin Graphite Wires"

AVS Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2014), December 7-11, 2014, Hawaii, USA.

 

M. Yagi, M. Ito and J. Shirakashi (Selected for the Best Student Paper Award of 3M-NANO 2014, also Invited)

"Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing"

4th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2014), October 27-31, 2014, Taipei, Taiwan.

 

M. Ito, M. Yagi, K. Morihara and J. Shirakashi

"Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration"

4th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (IEEE 3M-NANO 2014), October 27-31, 2014, Taipei, Taiwan.

 

M. Ito, R. Suda, T. Toyonaka, K. Takikawa and J. Shirakashi

"Nanogap Array Fabrication Using Field-Emission-Induced Electromigration"

2014 IEEE Nanotechnology Materials and Devices Conference (IEEE NMDC 2014), October 12-15, 2014, Aci Castello, Sicily, Italy.

 

N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori and J. Shirakashi

"Low-Temperature Deposition of Thin Si, Ge, and SiGe Films Using Reducing Activity of Ballistic Hot Electrons"

2014 ECS and SMEQ Joint International Meeting, October 5-9, 2014, Cancun, Mexico.

 

M. Yagi, R. Suda, A. Kojima, R. Mentek, N. Mori, J. Shirakashi and N. Koshida

"Deposition of Thin Si, Ge, and SiGe Films by Ballistic Hot Electron Reduction"

2014 International Conference on Solid State Devices and Materials (SSDM 2014), September 8-11, 2014, Tsukuba, Japan.

 

Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi

"A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA"

IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology), August 18-21, 2014, Toronto, ON, Canada.

 

K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi

"Resistive Switching Effects in Electromigrated Ni Nanogaps"

IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology), August 18-21, 2014, Toronto, ON, Canada.

 

Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi

"Ultra-Fast Feedback-Controlled Electromigration Using FPGA"

2014 International Conference on Nanoscience + Technology (ICN+T 2014), July 20-25, 2014, Vail, Colorado, USA.

 

K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi

"Fabrication of Resistive Switching Devices Based on Ni Nanogaps Using Field-Emission-Induced Electromigration"

2014 International Conference on Nanoscience + Technology (ICN+T 2014), July 20-25, 2014, Vail, Colorado, USA.

 

T. Toyonaka, R. Suda, M. Ito, K. Takikawa and J. Shirakashi

"Control of Tunnel Resistance of Suspended Ni Nanogaps Using Field-Emission-Induced Electromigration"

2014 International Conference on Nanoscience + Technology (ICN+T 2014), July 20-25, 2014, Vail, Colorado, USA.

 

M. Matayoshi, R. Suda and J. Shirakashi

"In-Situ Thermal Imaging of Thin Graphite Wires under Current Flow"

2014 International Conference on Nanoscience + Technology (ICN+T 2014), July 20-25, 2014, Vail, Colorado, USA.

 

R. Suda, M. Ito, K. Takikawa, T. Toyonaka and J. Shirakashi

"Formation Scheme of Nano-Scale Devices Using Electromigrated Ni Nanogaps"

2014 International Conference on Nanoscience + Technology (ICN+T 2014), July 20-25, 2014, Vail, Colorado, USA.

 

N. Koshida, N. Ikegami, A. Kojima, R. Mentek, R. Suda, M. Yagi, J. Shirakashi, B. Gelloz and N. Mori (Invited)

"Ballistic Hot Electron Effects in Nanosilicon Dots and Their Photonic Applications"

225th ECS Meeting, May 11-15, 2014, Orlando, FL, USA.

 

2013”N“x (FY 2013)

R. Suda, M. Ito, M. Yagi, A. Kojima, R. Mentek, N. Mori, J. Shirakashi and N. Koshida

"Ballistic Electro-Deposition of Thin Si, Ge, and SiGe Films"

2013 International Conference on Solid State Devices and Materials (SSDM 2013), September 24-27, 2013, Fukuoka, Japan.

 

R. Suda, S. Akimoto, K. Morihara and J. Shirakashi

"Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology), August 5-8, 2013, Beijing, China.

 

T. Saito, R. Suda and J. Shirakashi

"In-Situ Temperature Measurements of Joule-Heated Graphene Using Near-Infrared CCD Imaging System"

IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology), August 5-8, 2013, Beijing, China.

 

M. Ando, S. Akimoto, R. Suda and J. Shirakashi

"Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme"

IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology), August 5-8, 2013, Beijing, China.

 

J. Shirakashi (Solicited)

"Electromigration-Based Fabrication Methods for Single-Electron Transistors"

CMOS Emerging Technologies Research, 2013 Symposium, Hilton Whistler Resort and Spa, July 17-19, 2013, Whistler, BC, Canada.

 

2012”N“x (FY 2012)

R. Suda, T. Saito, A. A. Tseng and J. Shirakashi

"Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy"

5th IEEE International Nanoelectronics Conference (IEEE INEC 2013), January 2-4, 2013, Singapore.

 

S. Akimoto, R. Suda, M. Ito, M. Ando and J. Shirakashi (Selected for the Best Poster Award of IEEE INEC 2013)

"Conduction Mechanism of Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

5th IEEE International Nanoelectronics Conference (IEEE INEC 2013), January 2-4, 2013, Singapore.

 

I. Atsumo, T. Saito and J. Shirakashi

"Modification of Surface Structure of Graphite Using Joule Heating Process"

5th IEEE International Nanoelectronics Conference (IEEE INEC 2013), January 2-4, 2013, Singapore.

 

T. Saito, W. Lin, I. Atsumo and J. Shirakashi

"In-Situ Observation of Temperature Distribution of Microheaters Using Near-Infrared CCD Imaging System"

5th IEEE International Nanoelectronics Conference (IEEE INEC 2013), January 2-4, 2013, Singapore.

 

J. Shirakashi (Invited)

"Fabrication of Nano/Micro-Scale Structures Using Scanning Probe Microscopy"

The 2nd Annual World Congress of Nanoscience and Nanotechnology (Nano-S&T), October 26-28, 2012, Qingdao, China.

 

R. Suda, T. Ohyama, A. A. Tseng and J. Shirakashi (Invited)

"In-Situ Control of Quantum Point Contacts Using Scanning Probe Microscopy Scratch Lithography"

IEEE NANO 2012 (12th International Conference on Nanotechnology), August 20-23, 2012, Birmingham, UK.

 

M. Yagi, S. Akimoto, M. Ito and J. Shirakashi

"Investigation of Nanogap Formation Process Using Field-Emission-Induced Electromigration with Alternating Current Bias"

2012 International Conference on Nanoscience + Technology (ICN+T 2012), July 23-27, 2012, Paris, France.

 

J. Kitagawa, R. Suda and J. Shirakashi

"Room-Temperature Magnetoresistance Properties of Planar-Type Ni Nanostructures Controlled from Nanoconstrictions to Nanogaps"

19th International Conference on Magnetism (ICM2012), July 8-13, 2012, Busan, Korea.

 

M. Ito, V. Bouchiat and J. Shirakashi

"Mechanical Scratching Nanolithography of Graphene Using Scanning Probe Microscopy and Its Application to Fabrication of Nanoscale Devices"

The 5th JSPS International Training Program (ITP) International Symposium, June 18-19, 2012, Linkoping, Sweden.

 

2011”N“x (FY 2011)

M. Ito, S. Akimoto, S. Ueno and J. Shirakashi

"Field-Emission-Induced Electromigration for Integration and Control of Nanogaps"

International Conference on Nanoscience and Technology, China 2011 (ChinaNANO 2011), September 7-9, 2011, Beijing, China.

 

M. Yagi, R. Suda, T. Watanabe and J. Shirakashi

"Fabrication of Nanogaps Using Field-Emission-Induced Electromigration with Alternating Current Bias"

International Conference on Nanoscience and Technology, China 2011 (ChinaNANO 2011), September 7-9, 2011, Beijing, China.

 

R. Suda, M. Yagi, T. Watanabe and J. Shirakashi

"Formation Scheme of Quantum Point Contacts Based on Nanogaps Using Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology, China 2011 (ChinaNANO 2011), September 7-9, 2011, Beijing, China.

 

S. Akimoto, M. Ito, S. Ueno and J. Shirakashi

"Control Parameters for Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology, China 2011 (ChinaNANO 2011), September 7-9, 2011, Beijing, China.

 

M. Ito, S. Ueno, T. Watanabe, S. Akimoto and J. Shirakashi (Invited)

"Simultaneous Tuning of Tunnel Resistance of Integrated Nanogaps by Field-Emission-Induced Electromigration"

IEEE NANO 2011 (11th International Conference on Nanotechnology), August 15-18, 2011, Portland, OR, USA.

 

J. Shirakashi (Invited)

"Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

International Conference NANOMEETING 2011, May 24-27, 2011, Minsk, Belarus.

 

2010”N“x (FY 2010)

Y. Kuwabara, S. Nishimura, R. Zaharuddin and J. Shirakashi

"Investigation of Electromigration in Micrometer-Scale Metal Wires by In-Situ Optical Microscopy"

The 6th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE NEMS 2011), February 20-23, 2011, Kaohsiung, Taiwan.

 

S. Nishimura, R. Zaharuddin, Y. Kuwabara and J. Shirakashi

"Magnetoresistance Effects in Discrete Si Transistors"

55th Annual Conference on Magnetism and Magnetic Materials (MMM-2010), November 14-18, 2010, Atlanta, GA, USA.

 

K. Takiya, T. Watanabe and J. Shirakashi

"Fabrication of Planar-Type Ni/Vacuum/Ni Tunnel Junctions Based on Ferromagnetic Nanogaps Using Field-Emission-Induced Electromigration"

55th Annual Conference on Magnetism and Magnetic Materials (MMM-2010), November 14-18, 2010, Atlanta, GA, USA.

 

S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi

"Field-Emission-Induced Electromigration Method for the Integration of Single-Electron Transistors"

International Conference on Nanoscience and Technology (ICN+T 2010), August 23-27, 2010, Beijing, China.

 

K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi

"A Newly Investigated Approach for the Control of Tunnel Resistance of Nanogaps Using Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology (ICN+T 2010), August 23-27, 2010, Beijing, China.

 

S. Ueno, Y. Tomoda, W. Kume, M. Hanada, K. Takiya and J. Shirakashi

"Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

10th International Conference on Nanotechnology (IEEE NANO 2010)-Joint Symposium with NANO KOREA 2010, August 17-20, 2010, Seoul, Korea.

 

K. Takiya, Y. Tomoda, W. Kume, S. Ueno, T. Watanabe and J. Shirakashi

"Tuning of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration Using Current Source Mode"

10th International Conference on Nanotechnology (IEEE NANO 2010)-Joint Symposium with NANO KOREA 2010, August 17-20, 2010, Seoul, Korea.

 

2009”N“x (FY 2009)

W. Kume, Y. Tomoda, M. Hanada and J. Shirakashi

"Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009), September 1-3, 2009, Beijing, China.

 

T. Watanabe, Y. Tomoda and J. Shirakashi (Selected for the Best Poster Award of ChinaNANO 2009)

"Magnetoresistance Properties of Planar-Type Ferromagnetic Tunnel Junctions with Vacuum Barriers Fabricated by Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009), September 1-3, 2009, Beijing, China.

 

S. Itami, Y. Tomoda, R. Yasutake and J. Shirakashi

"Influence of Feedback Parameters on Resistance Control of Metal Nanowires by Stepwise Feedback-Controlled Electromigration"

International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009), September 1-3, 2009, Beijing, China.

 

S. Nishimura, Y. Eto, Y. Kuwabara and J. Shirakashi

"Control of Tunnel Resistance of Si Nanogaps Using Field-Emission-Induced Electromigration"

International Conference on Nanoscience and Technology China 2009 (ChinaNANO 2009), September 1-3, 2009, Beijing, China.

 

Y. Takemura and J. Shirakashi (Invited)

"Constriction of Ferromagnetic Patterned Thin Film by Scratch Process Using Atomic Force Microscope"

Seventeenth Annual International Conference on Composites/Nano Engineering (ICCE-17), July 26 - August 1, 2009, Honolulu, USA.

 

Y. Tomoda, M. Hanada, W. Kume, S. Itami, T. Watanabe and J. Shirakashi

"Fabrication of Planar-Type Ferromagnetic Tunnel Junctions Using Electromigration Method and Its Magnetoresistance Properties"

International Conference on Magnetism 2009 (ICM 2009), July 26-31, 2009, Karlsruhe, Germany.

 

Y. Tomoda, K. Takahashi, M. Hanada, W. Kume, S. Itami, T. Watanabe and J. Shirakashi

"Magnetoresistance Properties of Planar-Type Tunnel Junctions with Ferromagnetic Nanogap System Fabricated by Electromigration Method"

International Magnetics Conference 2009 (Intermag 2009), May 4-8, 2009, Sacramento, CA, USA.

 

2008”N“x (FY 2008)

K. M. Jang, K. Takahashi, T. Yamada, J. Shirakashi and Y. Takemura

"Constriction of Ferromagnetic Patterned Thin Film by Using AFM Nano Scratch Process"

Asian Magnetic Conference 2008 (AMC2008), December 10-13, 2008, Busan, Korea.

 

J. Shirakashi (Invited)

"SPM Lithography at the Micro- and Nano-Scales"

The 1st International Workshop on Tip-Based Nanofabrication (TBN2008), October 19-21, 2008, Taipei, Taiwan.

 

T. Toyofuku, S. Nishimura, K. Miyashita and J. Shirakashi (Selected for the Poster Award of TBN2008)

"10 Micrometer-Scale SPM Local Oxidation Lithography"

The 1st International Workshop on Tip-Based Nanofabrication (TBN2008), October 19-21, 2008, Taipei, Taiwan.

 

D. Iwata, Y. Shimada, T. Yamada, J. Shirakashi and Y. Takemura

"Dependence of Scanspeed of Cantilever in Measurement of Reaction Current of AFM Local Oxidation"

The 1st International Workshop on Tip-Based Nanofabrication (TBN2008), October 19-21, 2008, Taipei, Taiwan.

 

H. Suganuma, S. Hasegawa, T. Yamada, J. Shirakashi and Y. Takemura

"Nano-Oxidation of NiFe Thin Films with Al-Oxide Capped Layers by Atomic Force Microscope"

The 1st International Workshop on Tip-Based Nanofabrication (TBN2008), October 19-21, 2008, Taipei, Taiwan.

 

Y. Tomoda, K. Takahashi, M. Hanada, W. Kume and J. Shirakashi

"Fabrication of Nanogap Electrodes by Field-Emission-Induced Electromigration"

The 2008 International Conference on Nanoscience + Technology (ICN+T 2008), July 21-25, 2008, Keystone, CO, USA.

 

S. Nishimura, T. Toyofuku, K. Miyashita, Y. Takemura and J. Shirakashi

"Improvement of SPM Local Oxidation Nanolithography"

The 2008 International Conference on Nanoscience + Technology (ICN+T 2008), July 21-25, 2008, Keystone, CO, USA.

 

K. Takahashi, Y. Tomoda, S. Itami and J. Shirakashi

"Control of Channel Resistance on Metal Nanowires by Electromigration Patterning Method"

The 2008 International Conference on Nanoscience + Technology (ICN+T 2008), July 21-25, 2008, Keystone, CO, USA.

 

K. Miyashita, S. Nishimura, T. Toyofuku and J. Shirakashi

"Nanoscale Patterning of NiFe Surface by SPM Scratch Nanolithography"

The 2008 International Conference on Nanoscience + Technology (ICN+T 2008), July 21-25, 2008, Keystone, CO, USA.

 

Y. Shimada, D. Iwata, T. Yamada, J. Shirakashi and Y. Takemura

"Measurement of Reaction Current during Local Oxidation of Si and NiFe using Atomic Force Microscope"

The 2008 International Conference on Nanoscience + Technology (ICN+T 2008), July 21-25, 2008, Keystone, CO, USA.

 

Y. Takemura and J. Shirakashi (Invited)

"Magnetic and Electrical Properties of Magnetic Nano-Devices Fabricated by Atomic Force Microscope"

Moscow International Symposium on Magnetism (MISM2008), June 20-25, 2008, Moscow, Russia.

 

2007”N“x (FY 2007)

N. Ishii, T. Yokoyama, H. Shibata, T. Yamada, J. Shirakashi and Y. Takemura

"Magnetization Switching of Magnetic Submicron Structure Fabricated by Atomic Force Microscope"

The International Workshop on Nano-structured Materials and Magnetics (NMM2008), February 10-11, 2008, Okinawa, JAPAN.

 

R. Shindo, Y. Shimada, T. Yamada, J. Shirakashi and Y. Takemura

"Dependence of Cantilever Deflection in AFM Nano-Oxidation"

The International Workshop on Nano-structured Materials and Magnetics (NMM2008), February 10-11, 2008, Okinawa, JAPAN.

 

S. Hasegawa, S. Yamada, T. Yamada, J. Shirakashi and Y. Takemura

"AFM Nano-Oxidation of NiFe Thin Films Capped with Al-Oxide Layers for Planar-Type Tunnel Junction"

The International Workshop on Nano-structured Materials and Magnetics (NMM2008), February 10-11, 2008, Okinawa, JAPAN.

 

Y. Shimada, S. Hasegawa T. Yamada, J. Shirakashi and Y. Takemura

"Control of Reaction Current during AFM Nano-Oxidation of Ferromagnetic Thin Films Capped with Insulating Layers"

52nd Annual Conference on Magnetism and Magnetic Materials (MMM-2007), November 5-9, 2007, Tampa, FL, USA.

 

S. Kayashima, K. Takahashi, M. Motoyama and J. Shirakashi

"Wide-Range Control of Tunnel Resistance on Metallic Nanogaps Using Migration"

IVC-17/ICSS-13 and ICN+T2007, co-organized with NCSS-6/NSM-22/SVM-4, July 2-6, 2007, Stockholm, Sweden.

 

S. Nishimura, T. Ogino, Y. Takemura and J. Shirakashi

"Tapping Mode SPM Local Oxidation Nanolithography with Sub-10 nm Resolution"

IVC-17/ICSS-13 and ICN+T2007, co-organized with NCSS-6/NSM-22/SVM-4, July 2-6, 2007, Stockholm, Sweden.

 

T. Ogino, S. Nishimura and J. Shirakashi

"Nanoscale Patterning of Si Surface Using SPM Scratching"

IVC-17/ICSS-13 and ICN+T2007, co-organized with NCSS-6/NSM-22/SVM-4, July 2-6, 2007, Stockholm, Sweden.

 

S. Hasegawa, S. Yamada, Y. Ishibashi, T. Yamada, J. Shirakashi and Y. Takemura

"AFM Nanolithography of Metal Thin Films Capped with Insulating Layers and Its Application to Fabrication of Planar-Type Magnetic Tunnel Junction"

IVC-17/ICSS-13 and ICN+T2007, co-organized with NCSS-6/NSM-22/SVM-4, July 2-6, 2007, Stockholm, Sweden.

 

S. Nishimura, T. Ogino, Y. Takemura and J. Shirakashi

"Local Oxidation of Si Surfaces by Tapping Mode SPM: Size Dependence on Dynamic Properties of Cantilever"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

S. Nishimura, T. Ogino and J. Shirakashi

"Micrometer-Scale SPM Local Oxidation Lithography"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

T. Ogino, S. Nishimura and J. Shirakashi

"Sub-20 nm Scratch Nanolithography for Si Using SPM"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

S. Hasegawa, S. Yamada, Y. Ishibashi, T. Yamada, J. Shirakashi and Y. Takemura

"Fabrication of Planar-Type Magnetic Tunnel Junction Capped with Al2O3 Layer"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

N. Ishii, T. Yokoyama, H. Shibata, T. Yamada, J. Shirakashi and Y. Takemura

"Magnetization Reversal of Nanostructures in Magnetic Multilayer Fabricated by Atomic Force Microscope"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

Y. Shimada, T. Yamada, J. Shirakashi and Y. Takemura

"Measurement of Reaction Current during AFM Local Oxidation of Conductive Surfaces Capped with Insulating Layers"

2007 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2007), June 19-22, 2007, Nagano, JAPAN.

 

S. Yamada, T. Yamada, J. Shirakashi and Y. Takemura

"Electrical Properties of Planar-Type Magnetic Tunnel Junction Covered with Insulating Layer"

1st International Symposium on Advanced Magnetic Materials and Applications (ISAMMA), May 28 - June 1, 2007, Jeju Island, Korea.

 

T. Yokoyama, H. Shibata, N. Ishii, T. Yamada, J. Shirakashi and Y. Takemura

"Magnetization Reversal of Magnetic Nanostructures Fabricated by Atomic Force Microscope"

1st International Symposium on Advanced Magnetic Materials and Applications (ISAMMA), May 28 - June 1, 2007, Jeju Island, Korea.

 

2006”N“x (FY 2006)

Y. Tomoda, S. Nishimura, J. Shirakashi and Y. Takemura

"Local Oxidation Nanolithography of Co Thin Films Using SPM"

10th Joint MMM-Intermag Conference, January 7-11, 2007, Baltimore, Maryland, USA.

 

Y. Takemura and J. Shirakashi (Invited)

"Electrical Properties of Magnetic Thin Films with Modified Nanostructures by AFM Local Oxidation"

International Workshop on Nano-Structured Materials and Magnetics, November 14-16, 2006, Taiwan.

 

Y. Shimada, G. Watanabe, T. Yamada, J. Shirakashi and Y. Takemura

"Measurement of Faradaic Current during AFM Local Oxidation of Magnetic Thin Films Covered with Insulating Layers"

International Workshop on Nano-Structured Materials and Magnetics, November 14-16, 2006, Taiwan.

 

Y. Tomoda, S. Kayashima, T. Ogino, M. Motoyama, J. Shirakashi and Y. Takemura

"Planar-Type Ferromagnetic Tunnel Junctions Fabricated by SPM Local Oxidation"

17th International Conference on Magnetism (ICM 2006), August 20-25, 2006, Kyoto, JAPAN.

 

S. Nishimura, J. Shirakashi and Y. Takemura

"SPM Local Oxidation Nanolithography with Active Control of Cantilever Dynamics"

International Conference on Nanoscience and Technology (ICN+T 2006), July 30 - August 4, 2006, Basel, Swiss.

 

Y. Shimada, G. Watanabe, T. Yamada, Y. Takemura and J. Shirakashi

"Measurement of Faradaic Current during AFM Local Oxidation of Magnetic Metal Thin Films"

International Conference on Nanoscience and Technology (ICN+T 2006), July 30 - August 4, 2006, Basel, Swiss.

 

2005”N“x (FY 2005)

Y. Takehara, S. Hasegawa, S. Yamada, T. Yamada, Y. Takemura and J. Shirakashi

"Fabrication of Planar-Type Magnetic Tunnel Junction by AFM Nano-Lithography"

Joint Meeting on Magnetics, MAG-05-155, December 5-6, 2005, Pusan, Korea.

 

Y. Takemura and J. Shirakashi

"Control of Magnetic Properties in Magnetic Nanostructures by AFM-Lithography"

The Second Asian Forum on Magnetics, AF-3-7, December 8-10, 2005, Young Pyeong, Korea.

 

J. Shirakashi (Invited)

"Nb-Based Single-Electron Transistors at Room Temperature"

The International Science Forum 2005 in Akita Prefectural University (ISF-HONJO 2005) -Energy Forum for Environmental Preservation 21st Century-, November 10-12, 2005, Yurihonjo, Akita, JAPAN.

 

Y. Shibata, Y. Tomoda, J. Shirakashi and Y. Takemura

"Local Oxidation Nanolithography of Ferromagnetic Thin Films Using Tapping Mode SPM"

50th Annual Conference on Magnetism and Magnetic Materials (MMM-50), October 30 - November 3, 2005, San Jose, CA, USA.

 

Y. Tomoda, Y. Shibata, J. Shirakashi and Y. Takemura

"Magnetoresistance Effect of Planar-Type Ferromagnetic Tunnel Junctions"

50th Annual Conference on Magnetism and Magnetic Materials (MMM-50), October 30 - November 3, 2005, San Jose, CA, USA.

 

Y. Takemura and J. Shirakashi (Invited)

"AFM Lithography for Magnetic Nanostructures and Devices"

2005 International Symposium on Advanced Magnetic Technologies and International Symposium on Magnetic Materials and Applications (ISAMT/SOMMA 2005), August 24-27, 2005, Taipei, Taiwan.

 

Y. Takemura and J. Shirakashi (Invited)

"A New Approach of Nanolithography: Direct Modification of Electrical and Magnetic Properties in Magnetic Nanostructures Using AFM"

Twelfth International Conference on Composites/Nano Engineering (ICCE-12), August 1-6, 2005, Tenerife, Spain.

 

N. Funakoshi, G. Watanabe, T. Yamada, Y. Takemura and J. Shirakashi

"Faradaic Current during AFM Local Oxidation for Nanowires of Oxide"

13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'05), July 3-8, 2005, Sapporo, JAPAN.

 

N. Funakoshi, G. Watanabe, Y. Takemura, T. Yamada and J. Shirakashi

"Measurement of Faradaic Current in AFM Nano-Oxidation of Semiconductor and Its Dependence on Surface Conditions"

2005 MRS Spring Meeting, J6.5, March 28 - April 1, 2005, San Francisco, CA, USA.

 

‘“à‰ï‹c (Domestic Conferences)

2023”N“x (FY 2023)

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S. Li, D. Tsukayama, J. Shirakashi, and H. Imai

gEntanglement-variational Hardware-efficient Ansatz in SequentialADAPT-VQEh

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S. Li, D. Tsukayama, J. Wang, J. Shirakashi, and H. Imai

gConstructing Hardware Efficient Ansatz Using Sequential-ADAPT-VQEh

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‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA15p-B414-2A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

Artag JargalsaikhanA•½ˆä‰ÀØŽqA“‡“c–GŠGA”’Š~~ˆê

g—ÊŽqƒAƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚ð—p‚¢‚½ƒhƒ[ƒ“§ŒäƒVƒXƒeƒ€h

‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA15p-B414-3A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

“‡“c–GŠGA‹g“c’©‹PA”’Š~~ˆê

g’ŠoŒ^‘½”Œˆ˜_—‚ð‘g‚Ýž‚ñ‚¾ƒVƒ~ƒ…ƒŒ[ƒeƒbƒh—ÊŽqƒAƒj[ƒŠƒ“ƒOh

‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA15p-B414-4A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

[‘ò—z•½A“‡“c—LŠóA”’Š~~ˆê

gTime-Series Generative Adversarial Networks (TimeGAN)‚É‚æ‚鎞Œn—ñƒf[ƒ^¶¬‚ÆAuŒ´ŽqÚ‡‚Å‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX—\‘ªh

‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA15p-B414-11A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

‹â‹I‰pA”‹Œ´‘å‹MA‹g“c’©‹PA•Ä“c—D—¢A”’Š~~ˆê

g—ÊŽqƒAƒj[ƒ‰‚ð—p‚¢‚½•¨—ƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚ÌŽÀ‘•h

‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA16a-A410-3A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

‰Á“¡–FMA“‡“c–GŠGAâˆäšõ‘¾A”ª–Ø–ƒ”üŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½•¨—ƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚É‚¨‚¯‚é“®ìƒpƒ‰ƒ[ƒ^h

‘æ70‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA16a-A410-4A2023”Nt‹GAã’q‘åŠwŽl’JƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

“‡“c—LŠóA“‡“c–GŠGAŽO–ØŽiA•½ˆä‰ÀØŽqA”’Š~~ˆê

gAuƒiƒmƒƒCƒ„‚É‚¨‚¯‚é—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚ÌEcho State Network‚ð—p‚¢‚½ƒŠƒAƒ‹ƒ^ƒCƒ€—\‘ªƒVƒXƒeƒ€h

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21a-C201-3A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

“‡“c—LŠóAŽO–ØŽiA“‡“c–GŠGA”‹Œ´‘å‹MA”’Š~~ˆê

gVariational Mode Decomposition‚ÉŠî‚¢‚½Echo State Network‚É‚æ‚éAuƒiƒmƒƒCƒ„‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX—\‘ªh

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21a-C201-4A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

”‹Œ´‘å‹MAŽO–ØŽiA”’Š~~ˆê

g—ÊŽqŒÃ“TƒnƒCƒuƒŠƒbƒhƒŠƒUƒo[‚É‚¨‚¯‚éƒnƒ~ƒ‹ƒgƒjƒAƒ“‚Æî•ñˆ——e—Ê‚ÌŒŸ“¢h

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA22a-B101-2A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

•½ˆä‰ÀØŽqA“‡“c–GŠGA‹g“c’©‹PA•Ä“c—D—¢A”’Š~~ˆê

g—ÊŽqƒAƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚ð—p‚¢‚½ƒŠƒAƒ‹ƒ^ƒCƒ€’Ç]§Œäh

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA22a-B101-3A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

“‡“c–GŠGA‹g“c’©‹PAŽO–ØŽiA”’Š~~ˆê

g—ÊŽqƒCƒ“ƒXƒpƒCƒA[ƒhƒCƒWƒ“ƒOƒ}ƒVƒ“‚É‚¨‚¯‚éƒXƒsƒ“”»’è˜_—‚ƃAƒj[ƒŠƒ“ƒOŽè–@‚ÌŒŸ“¢h

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA22a-B101-4A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

‹g“c’©‹PAŽO–ØŽiA“‡“c–GŠGA•Ä“c—D—¢A”’Š~~ˆê

g’ŠoŒ^‘½”Œˆ˜_—‚ð—p‚¢‚½ƒCƒWƒ“ƒOƒ}ƒVƒ“‚É‚¨‚¯‚éƒXƒp[ƒXƒXƒPƒWƒ…[ƒ‹‚ÌÅ“K‰»h

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA22a-B101-5A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

ŽO–ØŽiA’ÉÎR‘å•ãA‰«“c—ÁA”’Š~~ˆêA¡ˆä_

g•Ï•ª—ÊŽqŒvŽZ‚Å‚Ì‘ª’èó‘Ԃ̃tƒBƒ‹ƒ^ƒŠƒ“ƒO‚É‚æ‚é•À—ñ—ÊŽq‰‰ŽZ‚̉Á‘¬ŒvŽZ–@h

‘æ83‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA22a-B101-6A2022”NH‹GA“Œ–k‘åŠwì“à–kƒLƒƒƒ“ƒpƒX•ƒIƒ“ƒ‰ƒCƒ“

 

2021”N“x (FY 2021)

’ÉÎR‘å•ãAŽO–ØŽiA‰«“c—ÁA”’Š~~ˆêA¡ˆä_

g—ÊŽqŒvŽZ‹@‚Å‚ÌŒù”z„’è‚ð—p‚¢‚½•Ï•ª—ÊŽqŒÅ—L’l–@‚É‚¨‚¯‚é•Ï•ªƒpƒ‰ƒ[ƒ^Å“K‰»h

‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA22p-E102-12A2022”Nt‹GAÂŽRŠw‰@‘åŠw‘Š–ÍŒ´ƒLƒƒƒ“ƒpƒX{ƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

ŽO–ØŽiA‰«“c—ÁA’ÉÎR‘å•ãA”’Š~~ˆêA¡ˆä_

gDivide-and-ConquerƒAƒvƒ[ƒ`‚ð—p‚¢‚½•Ï•ª—ÊŽqŒvŽZ‚É‚¨‚¯‚é—ÊŽqó‘Ô‚ÌÄ\¬¸“x‚Æ‹‰ð“Á«h

‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA22p-E102-13A2022”Nt‹GAÂŽRŠw‰@‘åŠw‘Š–ÍŒ´ƒLƒƒƒ“ƒpƒX{ƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

”‹Œ´‘å‹MA‘剪’‰¹A“c’†—Y‘åAŽO–ØŽiA”’Š~~ˆê

g—ÊŽqƒvƒƒZƒbƒT‚ð—p‚¢‚½—ÊŽqƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚É‚¨‚¯‚鑪’èƒIƒuƒU[ƒoƒuƒ‹‚ÌŒŸ“¢h

‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA22p-E102-14A2022”Nt‹GAÂŽRŠw‰@‘åŠw‘Š–ÍŒ´ƒLƒƒƒ“ƒpƒX{ƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

•½ˆä‰ÀØŽqA•Ä“c—D—¢A“‡“c–GŠGAŽO–ØŽiA‹g“c’©‹PA”’Š~~ˆê

g’Ç]§Œä–â‘è‚É‚¨‚¯‚é—ÊŽqƒAƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚Ì«”\•]‰¿h

‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA23a-E102-6A2022”Nt‹GAÂŽRŠw‰@‘åŠw‘Š–ÍŒ´ƒLƒƒƒ“ƒpƒX{ƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

“c’†—Y‘åAŽO–ØŽiA“‡“c–GŠGAâˆäšõ‘¾A”ª–Ø–ƒ”üŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g’¼•À—ñÚ‘±Œ^AuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½•¨—ƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒOh

‘æ69‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA23p-E102-12A2022”Nt‹GAÂŽRŠw‰@‘åŠw‘Š–ÍŒ´ƒLƒƒƒ“ƒpƒX{ƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

ŽO–ØŽiA‰«“c—ÁA•Ä“c—D—¢A“‡“c–GŠGA”’Š~~ˆê

g•Ï•ª—ÊŽqƒAƒ‹ƒSƒŠƒYƒ€‚É‚¨‚¯‚é—ÊŽq‰ñ˜H‚Ì•ªŠ„ŽÀ‘•‚Æ—ÊŽqó‘Ô‚ÌÄ\¬h

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA12p-S101-10A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‰«“c—ÁAŽO–ØŽiA“‡“c–GŠGA”’Š~~ˆê

gƒQ[ƒgŒ^—ÊŽqŒvŽZ‹@‚ÉŽÀ‘•‚µ‚½QAOA‚É‚¨‚¯‚éŠm—¦“IŒù”z~‰º–@‚É‚æ‚é•Ï•ªƒpƒ‰ƒ[ƒ^‚ÌÅ“K‰»h

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA12p-S101-11A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

’ÉÎR‘å•ãAŽO–ØŽiA‰«“c—ÁA”’Š~~ˆê

g•Ï•ªŒÅ—L’lƒ\ƒ‹ƒo[‚É‚¨‚¯‚é—ÊŽq‰ñ˜H‚ƌÓTÅ“K‰»Žè–@‚ÌŒŸ“¢h

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA12p-S101-12A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‘剪’‰¹A´ì介èA‰«“c—ÁAâˆäšõ‘¾AŽO–ØŽiA”’Š~~ˆê

g—ÊŽqƒvƒƒZƒbƒT‚ð—p‚¢‚½—ÊŽqƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚ÌQubit”‚ÌŒŸ“¢h

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA12p-S101-14A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‹g“c’©‹PAŽO–ØŽiA“‡“c–GŠGA•Ä“c—D—¢A”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚é’ŠoŒ^‘½”Œˆ˜_—‚ł̃Xƒsƒ“ƒ_ƒCƒiƒ~ƒNƒX‚̃{ƒ‹ƒcƒ}ƒ““Œv‚Æ‚Ì”äŠrh

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-S101-2A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

•Ä“c—D—¢A“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gŒ´ŽqÚ‡‚Ì컂ɂ¨‚¯‚é—ÊŽqƒAƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^’Tõh

‘æ82‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-S101-3A2021”NH‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

ŽO–ØŽiA“‡“c–GŠGA‰«“c—ÁA”’Š~~ˆê i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB“dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDŒ¤j —ߘa3”N5ŒŽŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

g—ÊŽqŒvŽZ‹@‚ÉŽÀ‘•‚³‚ꂽ—ÊŽqEŒÃ“TƒnƒCƒuƒŠƒbƒhƒAƒ‹ƒSƒŠƒYƒ€‚É‚æ‚éŒÅ—L’l–â‘è‚Ì‹‰ðh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDju‹@”\«ƒfƒoƒCƒXÞ—¿Eì»E“Á«•]‰¿‚¨‚æ‚ÑŠÖ˜A‹ZpvA2021”N5ŒŽ27“úAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‹g“c’©‹PAŽO–ØŽiA“‡“c–GŠGA•Ä“c—D—¢A”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éŒðŠ·‘ŠŒÝì—p‚̃Xƒp[ƒX‰»‚É‚æ‚éƒXƒsƒ“XVŽè–@h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDju‹@”\«ƒfƒoƒCƒXÞ—¿Eì»E“Á«•]‰¿‚¨‚æ‚ÑŠÖ˜A‹ZpvA2021”N5ŒŽ27“úAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

2020”N“x (FY 2020)

ŽO–ØŽiA“‡“c–GŠGA‰«“c—ÁA”’Š~~ˆê

gƒQ[ƒg•ûŽ®—ÊŽqŒvŽZ‹@(IBM-Q)‚ð—p‚¢‚½Variational Quantum Eigensolver‚É‚æ‚é‘g‡‚¹Å“K‰»h

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19a-Z34-7A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

ŽO–ØŽiA“‡“c–GŠGA‰«“c—ÁA”’Š~~ˆê

gŒÅ—L’l–â‘è‚Ì‹‰ð‚ÉŒü‚¯‚½•Ï•ª—ÊŽq‰ñ˜H‚Ì\¬‚Æ—ÊŽqƒRƒ“ƒsƒ…[ƒ^‚É‚æ‚鉉ŽZ“Á«‚ÌŒŸ“¢h

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19a-Z34-8A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‰«“c—ÁAŽO–ØŽiA“‡“c–GŠGA”’Š~~ˆê

gƒQ[ƒgŒ^—ÊŽqŒvŽZ‹@‚ð—p‚¢‚½Quantum Approximate Optimization Algorithm‚ÌŽÀ‘•h

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19a-Z34-9A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

•Ä“c—D—¢A“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gƒgƒ|ƒƒW[‚̈قȂé—ÊŽqƒAƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚É‚¨‚¯‚é‘g‡‚¹Å“K‰»–â‘è‚̉‰ŽZ«”\h

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19a-Z34-10A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‹g“c’©‹PAŽO–ØŽiA“‡“c–GŠGA•Ä“c—D—¢A”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚鑽”Œˆ˜_—‚Å‚ÌŒ‹‡ƒXƒsƒ“‚̃Xƒp[ƒX‰»‚É‚æ‚éŠî’êó‘Ô’Tõh

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19a-Z34-11A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

‘剪’‰¹AŽO–ØŽiA”’Š~~ˆê

gReservoir Computing‚ð—p‚¢‚½AuƒiƒmƒƒCƒ„‹·ó‰»‚É‚¨‚¯‚éƒRƒ“ƒ_ƒNƒ^ƒ“ƒX”gŒ`‚Ì—\‘ªh

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19p-Z34-14A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

“n•”Œ’‘¾A‰«“c—ÁAŽO–ØŽiA¬ŽR—È–çA”’Š~~ˆê

g—ÊŽqƒvƒƒZƒbƒT‚ð—p‚¢‚½—ÊŽqƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒOh

‘æ68‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19p-Z34-17A2021”Nt‹GAƒIƒ“ƒ‰ƒCƒ“ŠJÃ

 

¬ŽR—È–çA´ì介èA“n•”Œ’‘¾A”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‹·ó‰»‰ß’ö‚É‚¨‚¯‚é’ïR§Œäƒpƒ‰ƒ[ƒ^‚̃xƒCƒYÅ“K‰»‚É‚æ‚é‘I‘ðh

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9a-Z28-7A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

â¼G‹KA“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gAuŒ´Žqڇ컂ł̕]‰¿ŠÖ”‚Ìd‚Ý’²®‚É‚æ‚éƒCƒWƒ“ƒOƒ}ƒVƒ“‚ð—p‚¢‚½—ÊŽqó‘Ô§Œäh

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9a-Z28-8A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

ŽO–ØŽiA“‡“c–GŠGA”’Š~~ˆê

gƒXƒsƒ“”»’è˜_—‚̃nƒCƒuƒŠƒbƒh‰»‚É‚æ‚é˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚Å‚ÌŠî’êó‘Ô’Tõh

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9a-Z28-11A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

´ì介èA¬ŽR—È–çA“n•”Œ’‘¾A”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒvƒŠƒUƒo[‚ð—p‚¢‚½ŽžŒn—ñƒf[ƒ^—\‘ª‚É‚¨‚¯‚éƒ}ƒXƒNŠÖ”‚̉e‹¿h

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9p-Z28-8A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

“n•”Œ’‘¾A´ì介èA¬ŽR—È–çA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒŠƒUƒo[‚̧Œäƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9p-Z28-10A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gSQAŽÀ‘•Œ^ƒCƒWƒ“ƒOƒ}ƒVƒ“‚É‚æ‚鉉ŽZ“Á«‚ÌŒŸ“¢h

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9p-Z28-14A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

•Ä“c—D—¢AŽO–ØŽiA“‡“c–GŠGA”’Š~~ˆê

gQUBO‚É‚æ‚é‘g‡‚¹Å“K‰»–â‘è‚Ì–„‚ßž‚Ý‚ð—p‚¢‚½˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚ÌŒŸ“¢h

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9p-Z28-15A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

²”Œ‘å’nA“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gŽžŒn—ñ—\‘ªƒ‚ƒfƒ‹‚É‚æ‚éAuƒiƒmƒƒCƒ„—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚̃ŠƒAƒ‹ƒ^ƒCƒ€—\‘ªh

‘æ81‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA9p-Z28-19A2020”NH‹GA‹ž“siƒIƒ“ƒ‰ƒCƒ“ŠJÃj

 

2019”N“x (FY 2019)

âˆäšõ‘¾A´ì介èA¬ŽR—È–çA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒŠƒUƒo[‚Ì’ZŠú‹L‰¯‚Æ”ñüŒ`“®ì“Á«h

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14a-A301-6A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

´ì介èAâˆäšõ‘¾A¬ŽR—È–çA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒŠƒUƒo[ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚É‚æ‚鎞Œn—ñƒf[ƒ^—\‘ªh

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14a-A301-7A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

¬ŽR—È–çAâˆäšõ‘¾A´ì介èA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒxƒCƒYÅ“K‰»‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^‚Ì’Tõ‚É‚æ‚éAuƒiƒmƒMƒƒƒbƒv‚Å‚Ì’ïR§Œä‚ÌŒŸ“¢h

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-4A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

ŸNˆä‘ñÆA•½“c‘é‰îA“‡“c–GŠGA²”Œ‘å’nA”’Š~~ˆê

gAuŒ´ŽqÚ‡‚Å‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä‚É‚¨‚¯‚éƒxƒCƒYÅ“K‰»‚ð—p‚¢‚½ƒ}ƒ‹ƒ`ŽÀŒ±ƒpƒ‰ƒ[ƒ^‚Ì’Tõh

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-5A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

²”Œ‘å’nA‹ù’J—DŠóAŸNˆä‘ñÆA”’Š~~ˆê

gFCE–@‚É‚æ‚é—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä‚É‚¨‚¯‚éRNN‚ð—p‚¢‚½ŽÀŒ±”gŒ`—\‘ªh

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-10A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

ŽO–ØŽiA“‡“c–GŠGA•½“c‘é‰îA”’Š~~ˆê

gQUBO‚ð—p‚¢‚½˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒrƒbƒgŠÔŒ‹‡‚Ì‚ŠK’²‰»‚ƃOƒ‰ƒtÊF–â‘è‚ÌŒŸ“¢h

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-11A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

â¼G‹KA•½“c‘é‰îA“‡“c–GŠGAŽO–ØŽiA”’Š~~ˆê

gƒCƒWƒ“ƒOƒ}ƒVƒ“‚É‚æ‚é—ÊŽqŽÀŒ±ƒpƒ‰ƒ[ƒ^Å“K‰»‚É‚¨‚¯‚é•]‰¿ŠÖ”‚ÌŒŸ“¢h

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-12A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

“‡“c–GŠGAŽO–ØŽiA•½“c‘é‰îA”’Š~~ˆê

gSQA‚ðŽÀ‘•‚µ‚½ƒCƒWƒ“ƒOƒ}ƒVƒ“‚É‚æ‚éTSP‚ÌŒŸ“¢h

‘æ67‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A301-13A2020”Nt‹GA“Œ‹ž@yVŒ^ƒRƒƒiƒEƒCƒ‹ƒXŠ´õŠg‘å‚É‚æ‚è’†Ž~z

 

‹ù’J—DŠóAŸNˆä‘ñÆA•½“c‘é‰îAâˆäšõ‘¾A”’Š~~ˆê

gReservoir Computing‚ð—p‚¢‚½ŽèŽwŠÖß‚Ì“®ì—\‘ªh

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-F211-1A2019”NH‹GA–kŠC“¹

 

âˆäšõ‘¾A²“¡—F”üA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒŠƒU[ƒoƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚ÌŒŸ“¢h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-F211-3A2019”NH‹GA–kŠC“¹

 

âˆäšõ‘¾A²“¡—F”üA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒvƒVƒiƒvƒX‘fŽq‚ÌLearning-Forgetting“Á«h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20a-F211-6A2019”NH‹GA–kŠC“¹

 

•½“c‘é‰îAŸNˆä‘ñÆAŽO–ØŽiA“‡“c–GŠGA”’Š~~ˆê

gFPGAã‚̃CƒWƒ“ƒOŒvŽZ‹@‚Å‚ÌŠî’êó‘Ô’Tõ‚É‚æ‚éŽÀŒ±ƒpƒ‰ƒ[ƒ^‚ÌŒˆ’è‚ÆAuŒ´ŽqÚ‡‚ÌŒ`¬h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-F211-3A2019”NH‹GA–kŠC“¹

 

ŸNˆä‘ñÆA•½“c‘é‰îA”’Š~~ˆê

gƒxƒCƒYÅ“K‰»‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^‚Ì’Tõ‚É‚æ‚éAuŒ´ŽqÚ‡‚ÌŒ`¬h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-F211-4A2019”NH‹GA–kŠC“¹

 

ŽO–ØŽiA“‡“c–GŠGA•½“c‘é‰îAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒrƒbƒgŠÔŒ‹‡‚ª‚ŠK’²‰»‚³‚ꂽ˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚æ‚éTSP‚ÌŒŸ“¢h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-F211-5A2019”NH‹GA–kŠC“¹

 

“‡“c–GŠGAŽO–ØŽiA•½“c‘é‰îAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gSQA‚É‚¨‚¯‚éReverse AnnealingƒXƒPƒWƒ…[ƒ‹‚Ɖ‰ŽZ“Á«h

‘æ80‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-F211-7A2019”NH‹GA–kŠC“¹

 

ŽO–ØŽiAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóA•½“c‘é‰îA“‡“c–GŠGA”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒrƒbƒgŠÔŒ‹‡ƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDju‹@”\«ƒfƒoƒCƒXÞ—¿Eì»E“Á«•]‰¿‚¨‚æ‚ÑŠÖ˜A‹ZpvA2019”N5ŒŽ16“úAɪ

 

“‡“c–GŠGAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóA•½“c‘é‰îAŽO–ØŽiA”’Š~~ˆê

g2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒXƒsƒ“”»’è˜_—‚Ɖ‰ŽZ“Á«h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDju‹@”\«ƒfƒoƒCƒXÞ—¿Eì»E“Á«•]‰¿‚¨‚æ‚ÑŠÖ˜A‹ZpvA2019”N5ŒŽ16“úAɪ

 

ŸNˆä‘ñÆA’|—ÑŒh‘¾A•½“c‘é‰îA”’Š~~ˆê

gGA‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^i‰»Žè–@‚ÆAuŒ´ŽqÚ‡‚ÌŽ©“®Œ`¬h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDju‹@”\«ƒfƒoƒCƒXÞ—¿Eì»E“Á«•]‰¿‚¨‚æ‚ÑŠÖ˜A‹ZpvA2019”N5ŒŽ17“úAɪ

 

2018”N“x (FY 2018)

Ž­Žq“c“‘åA‹ù’J—DŠóA”’Š~~ˆê

güŒ`‚¨‚æ‚Ñ”ñüŒ`ƒVƒXƒeƒ€‚ð—p‚¢‚½ŽžŒn—ñƒf[ƒ^‚Ì—\‘ªh

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-W810-5A2019”Nt‹GA“Œ‹ž

 

‹ù’J—DŠóAŽ­Žq“c“‘åA”’Š~~ˆê

g¶‘̃f[ƒ^„’è‚É“K—p‚µ‚½Recurrent Neural Networks‚É‚¨‚¯‚éŠwKƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-W810-6A2019”Nt‹GA“Œ‹ž

 

²“¡—F”üAâˆäšõ‘¾A“ì_“ñA’J‘n‹MAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒvƒAƒŒƒC‚É‚¨‚¯‚éƒVƒiƒvƒX“®ì‚ð—˜—p‚µ‚½ƒpƒ^[ƒ“‹L‰¯‚ÌŒŸ“¢h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11p-W810-6A2019”Nt‹GA“Œ‹ž

 

âˆäšõ‘¾A²“¡—F”üA“ì_“ñA’J‘n‹MAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gWω»AuƒiƒmƒMƒƒƒbƒv‚É‚¨‚¯‚é”]Œ^‰‰ŽZ“Á«h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11p-W810-7A2019”Nt‹GA“Œ‹ž

 

“‡“c–GŠGAˆÉ“¡ŒõŽ÷A•½“c‘é‰îAŽO–ØŽiA”’Š~~ˆê

g2DƒCƒWƒ“ƒOƒ}ƒVƒ“‚̉‰ŽZ“Á«‚É‚©‚©‚éSimulated Quantum Annealing‚ÌŒø‰Êh

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA12a-W934-6A2019”Nt‹GA“Œ‹ž

 

ŽO–ØŽiAˆÉ“¡ŒõŽ÷A•½“c‘é‰îA“‡“c–GŠGA”’Š~~ˆê

gƒrƒbƒgŠÔŒ‹‡‚ª‚ŠK’²‰»‚³‚ꂽ˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚æ‚é‘g‡‚¹Å“K‰»–â‘è‚ÌŒŸ“¢h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA12a-W934-7A2019”Nt‹GA“Œ‹ž

 

•½“c‘é‰îAŸNˆä‘ñÆA’|—ÑŒh‘¾AŽðˆä³‘¾˜YA”’Š~~ˆê

gFPGA‚ÉŽÀ‘•‚³‚ꂽƒCƒWƒ“ƒOƒ}ƒVƒ“‚Å‚ÌŽÀŒ±ƒpƒ‰ƒ[ƒ^Œˆ’èƒVƒXƒeƒ€‚Ì\’z‚ÆAuŒ´ŽqÚ‡‚ÌŽ©“®ì»h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA12a-W934-8A2019”Nt‹GA“Œ‹ž

 

’|—ÑŒh‘¾AŸNˆä‘ñÆA•½“c‘é‰îAŠâ“c˜Ð”nA”’Š~~ˆê

gFPGAã‚̈â“`“IƒAƒ‹ƒSƒŠƒYƒ€‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^i‰»Žè–@‚É‚æ‚éAuŒ´ŽqÚ‡‚Ìì»h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA12a-W934-9A2019”Nt‹GA“Œ‹ž

 

’J‘n‹MA“ì_“ñAâˆäšõ‘¾A²“¡—F”üA“‡“c–GŠGAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‹·ó‰»‚É‚¨‚¯‚é’Ê“dŽè–@‚ÌŒŸ“¢‚Æ’Pˆê“dŽq‘Ñ“d“Á«h

‘æ66‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA12p-W934-6A2019”Nt‹GA“Œ‹ž

 

ˆÉ“¡ŒõŽ÷A•½“c‘é‰îA“‡“c–GŠGA–ØŒ´—T‰îA”’Š~~ˆê

g2DƒCƒWƒ“ƒOƒ}ƒVƒ“‚Ö‚Ì—ÊŽqƒAƒj[ƒŠƒ“ƒO‚Ì‘g‚Ýž‚݂Ɖ‰ŽZ“Á«h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21a-221A-1A2018”NH‹GA–¼ŒÃ‰®

 

‹ù’J—DŠóAŽ­Žq“c“‘åA”’Š~~ˆê

gBinary Neural Networks‚É‚æ‚él‘¢•‰”˜cƒZƒ“ƒT‚ð—p‚¢‚½“®ì—\‘ªh

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21a-221A-2A2018”NH‹GA–¼ŒÃ‰®

 

ŸNˆä‘ñÆA•½“c‘é‰îAŠâ“c˜Ð”nA’|—ÑŒh‘¾A”’Š~~ˆê

gAuŒ´ŽqÚ‡‚Ì‚½‚ß‚ÌFPGAã‚ÌlH’m”\‚ÆŽÀŒ±ƒpƒ‰ƒ[ƒ^‚ÌŽ©—¥Å“K‰»h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21p-221A-4A2018”NH‹GA–¼ŒÃ‰®

 

•½“c‘é‰îAŸNˆä‘ñÆAŽðˆä³‘¾˜YA”’Š~~ˆê

gAuŒ´ŽqÚ‡‚̃Rƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä‚É‚¨‚¯‚é3‚‚̎ÀŒ±ƒpƒ‰ƒ[ƒ^‚ł̃Aƒj[ƒŠƒ“ƒOƒ}ƒVƒ“‚É‚æ‚é‰ð’Tõh

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21p-221A-5A2018”NH‹GA–¼ŒÃ‰®

 

âˆäšõ‘¾A“ì_“ñA’J‘n‹MA²“¡—F”üAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒVƒiƒvƒX‘fŽq‚É‚¨‚¯‚éSTDPŠwK“Á«h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA21p-221A-6A2018”NH‹GA–¼ŒÃ‰®

 

’J‘n‹MA“ì_“ñAâˆäšõ‘¾A“‡“c–GŠGAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

g’ቷ‚É‚¨‚¯‚éAuƒiƒmƒMƒƒƒbƒv‚Ì’Ê“d‹·ó‚É‚æ‚éSETì»ðŒ‚ÌŒŸ“¢h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-2A2018”NH‹GA–¼ŒÃ‰®

 

“ì_“ñA’J‘n‹MAâˆäšõ‘¾AˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv“d‹ÉŠÔ‚É”z’u‚µ‚½Auƒiƒm\‘¢‘Ì‚Ì’Ê“d‚É‚æ‚é‹·ó“Á«h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-5A2018”NH‹GA–¼ŒÃ‰®

 

’|—ÑŒh‘¾AŸNˆä‘ñÆA•½“c‘é‰îA”’Š~~ˆê

gGAƒJƒXƒ^ƒ€ƒn[ƒhƒEƒFƒA‚ð—p‚¢‚½AuŒ´ŽqÚ‡‚Ìì»h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-6A2018”NH‹GA–¼ŒÃ‰®

 

²“¡—F”üAâˆäšõ‘¾A“ì_“ñA’J‘n‹MAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒ}ƒ‹ƒ`“d‹ÉŒ^ƒiƒmƒMƒƒƒbƒv‚Å‚Ì’Ê“d‹·ó‚ƃVƒiƒvƒX“®ì“Á«h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-7A2018”NH‹GA–¼ŒÃ‰®

 

ŽO–ØŽiAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóA“‡“c–GŠGA‰–‘º^KA”’Š~~ˆê

g˜_—ƒQ[ƒgƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éƒXƒsƒ“Œ‹‡”‚ÌŒŸ“¢h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-8A2018”NH‹GA–¼ŒÃ‰®

 

“‡“c–GŠGAˆÉ“¡ŒõŽ÷A‹ù’J—DŠóAŽO–ØŽiA‰–‘º^KA”’Š~~ˆê

g˜_—•\Œ»‚³‚ꂽ2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚ł̃Xƒsƒ“”»’è˜_—‚Ɖ‰ŽZ“Á«h

‘æ79‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20p-PB3-9A2018”NH‹GA–¼ŒÃ‰®

 

”’Š~~ˆê (Solicited)

gƒCƒWƒ“ƒOƒ}ƒVƒ“‚Å‚ÌŽÀŒ±ðŒ’Tõ‚ÆÅ“K‰»‚É‚æ‚éAuŒ´ŽqÚ‡‚Ì컂Ɨʎqó‘Ô§Œäh

2018”N“dŽqî•ñ’ÊMŠw‰ïƒ\ƒTƒCƒGƒeƒB‘å‰ïACI-2-4iCI-2.lH’m”\‚ÆÞ—¿EƒfƒoƒCƒXjA2018”N9ŒŽ11-14“úA‹à‘ò

 

2017”N“x (FY 2017)

•½“c‘é‰îAŽðˆä³‘¾˜YAŠâ“c˜Ð”nAŸNˆä‘ñÆA”’Š~~ˆê

gAuŒ´ŽqÚ‡‚Ì’Ê“d‹·ó‰»‚É‚¨‚¯‚éƒCƒWƒ“ƒOƒXƒsƒ“ƒ‚ƒfƒ‹‚É‚æ‚é•¡”‚ÌŽÀŒ±ƒpƒ‰ƒ[ƒ^‚Å‚Ì“¯ŽžÅ“K‰»h

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F210-10A2018”Nt‹GA“Œ‹ž

 

âˆäšõ‘¾A“ì_“ñA’J‘n‹MA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ł̃VƒiƒvƒX“®ì“Á«h

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F210-12A2018”Nt‹GA“Œ‹ž

 

‰–‘º^KA–ØŒ´—T‰îAŽðˆä³‘¾˜YAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g‘¦’f‘¦Œˆ˜_—‚ð—p‚¢‚½ƒCƒWƒ“ƒOŒvŽZ‹@‚É‚¨‚¯‚éŽû‘©“Á«‚ÌŒŸ“¢h

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F210-14A2018”Nt‹GA“Œ‹ž

 

‹ù’J—DŠóAŽ­Žq“c“‘åA–ØŒ´—T‰îA”’Š~~ˆê

g[‘wŠwK‚É‚æ‚él‘¢•‰”˜cƒZƒ“ƒTŒ^ƒf[ƒ^ƒOƒ[ƒu‚Ì“®ì—\‘ªh

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18a-P4-1A2018”Nt‹GA“Œ‹ž

 

–ØŒ´—T‰îA‰–‘º^KAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gFPGA‚ÉŽÀ‘•‚µ‚½ƒCƒWƒ“ƒOƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚ł̉‰ŽZ“Á«‚ÌŒŸ“¢h

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18a-P4-2A2018”Nt‹GA“Œ‹ž

 

ŸNˆä‘ñÆAŠâ“c˜Ð”nAŽðˆä³‘¾˜YA•½“c‘é‰îA”’Š~~ˆê

gFPGA‚ÉŽÀ‘•‚³‚ꂽlH’m”\‚É‚æ‚éAuŒ´ŽqÚ‡‚Ìì»h

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18a-P4-3A2018”Nt‹GA“Œ‹ž

 

K. Oshinari, M. Kondo, M. Yagi, M. Hasumi, W. Kubo, J. Shirakashi, T. Sameshima, M. Amara

"Reduction in Connecting Resistivity of Intermediate Adhesive Layer by SF6 Plasma Treatment for Mechanical Stacking Multi Junction Solar Cells"

‘æ65‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA20a-C101-4A2018”Nt‹GA“Œ‹ž

 

Žðˆä³‘¾˜YAŠâ“c˜Ð”nA‰–‘º^KA–ØŒ´—T‰îA”’Š~~ˆê

gƒCƒWƒ“ƒOƒ}ƒVƒ“‚Å‚ÌŽÀŒ±ƒpƒ‰ƒ[ƒ^’Tõ‚ÆÅ“K‰»‚É‚æ‚éAuŒ´ŽqÚ‡‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œäh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2018”N2ŒŽ28“úA–kŠC“¹

 

Šâ“c˜Ð”nAŽðˆä³‘¾˜YAÀ‘qŒ›•jA”’Š~~ˆê

glH’m”\‚É‚æ‚èŽx‰‡‚³‚ꂽAuŒ´ŽqÚ‡‚Ì컂Ɨʎqó‘Ô‚ÌŠÏ‘ªh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2018”N2ŒŽ28“úA–kŠC“¹

 

”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gIn Situ AFMŠÏŽ@‚³‚ꂽAuƒiƒmƒ`ƒƒƒlƒ‹‚É‚¨‚¯‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“’†‚Ì”­”M‰·“x‚Ìi“Wh

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA6a-C21-8A2017”NH‹GA•Ÿ‰ª

 

âˆäšõ‘¾A“ì_“ñA’J‘n‹MA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒ}ƒ‹ƒ`“d‹ÉŒ^ƒiƒmƒMƒƒƒbƒv‚Å‚Ì’Ê“d‹·ó“Á«h

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA7a-PB1-1A2017”NH‹GA•Ÿ‰ª

 

“ì_“ñA’J‘n‹MA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g’¼•À—ñÚ‘±AuƒiƒmƒMƒƒƒbƒv‰ñ˜H‚Å‚Ì’Ê“dŒo˜H‚̉Ž‹‰»‚ƧŒäh

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA7a-PB1-2A2017”NH‹GA•Ÿ‰ª

 

’J‘n‹MA“ì_“ñAˆäã˜a‹MA”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g’¼—ñÚ‘±Œ^AuƒiƒmƒMƒƒƒbƒv‚Å‚Ì“¯Žž’Ê“d‚É‚æ‚é\‘¢•Ï’²‚Æ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^“Á«h

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA7a-PB1-6A2017”NH‹GA•Ÿ‰ª

 

Žðˆä³‘¾˜YAŠâ“c˜Ð”nA‰–‘º^KA–ØŒ´—T‰îA”’Š~~ˆê

gƒCƒWƒ“ƒOƒXƒsƒ“ƒ‚ƒfƒ‹‚ð—p‚¢‚½“®“I‚ÈŠwK‚ÆÅ“Kƒpƒ‰ƒ[ƒ^’Tõ‚É‚æ‚é—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚ÌŽ©—¥§Œäh

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA8p-A412-2A2017”NH‹GA•Ÿ‰ª

 

Šâ“c˜Ð”nAŽðˆä³‘¾˜YAÀ‘qŒ›•jA”’Š~~ˆê

glH’m”\“IƒAƒvƒ[ƒ`‚ð—p‚¢‚½ŽÀŒ±ƒpƒ‰ƒ[ƒ^‚ÌŽ©—¥“I‚ÈÝ’è‚É‚æ‚éAuŒ´ŽqÚ‡‚Å‚Ì—ÊŽqó‘Ô§Œäh

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA8p-A412-3A2017”NH‹GA•Ÿ‰ª

 

Ž­Žq“c“‘åA–ØŒ´—T‰îA”’Š~~ˆê

g”M•ª‰ð•‰”ƒV[ƒg˜cƒZƒ“ƒT‚É‚æ‚葪’肳‚ꂽŠÖß“®ìƒf[ƒ^‚ð—p‚¢‚½[‘wŠwK‚É‚æ‚él‘Ìs“®—\‘ª‚ÌŒŸ“¢h

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA8p-A412-4A2017”NH‹GA•Ÿ‰ª

 

{“c—²‘¾˜YA¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

g’e“¹“dŽqÆŽË‚É‚æ‚éŠÒŒ³«”––Œ‘Íωߒö‚̃‚ƒfƒŠƒ“ƒOh

‘æ78‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA6a-C21-6A2017”NH‹GA•Ÿ‰ª

 

2016”N“x (FY 2016)

’J‘n‹MAˆÉ“¡ŒõŽ÷A“ì_“ñA”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚Å‚Ì’Ê“d‚É‚æ‚é\‘¢•Ï’²‚Æ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^“Á«h

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14a-E206-4A2017”Nt‹GA_“Þì

 

Ž­Žq“c“‘åA–ØŒ´—T‰îAâV“¡F¬A”’Š~~ˆê

g”M•ª‰ð•‰”ƒV[ƒg‚ð—p‚¢‚½˜cƒZƒ“ƒT‚É‚æ‚éƒf[ƒ^ƒOƒ[ƒuh

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-E206-4A2017”Nt‹GA_“Þì

 

“ì_“ñAˆÉ“¡ŒõŽ÷A’J‘n‹MA”’Š~~ˆê

g’¼•À—ñ‚ÉÚ‘±‚³‚ꂽƒiƒmƒMƒƒƒbƒvŒ^ƒgƒ“ƒlƒ‹Ú‡‚Ì’Ê“d“®ì‚Æ’á’ïR‰»h

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-E206-9A2017”Nt‹GA_“Þì

 

‰Á“¡–Ø—IAŠâ“c˜Ð”nAÀ‘qŒ›•jAŽðˆä³‘¾˜YA”’Š~~ˆê

gFPGA‚ð—p‚¢‚½AuƒiƒmƒƒCƒ„‚ɑ΂·‚é’´‚‘¬FCE–@‚Å‚Ì—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä‚ÌŽ©—¥’m”\‰»h

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-E206-10A2017”Nt‹GA_“Þì

 

Žðˆä³‘¾˜YAŠâ“c˜Ð”nA‰Á“¡–Ø—IA‰–‘º^KA–ØŒ´—T‰îA”’Š~~ˆê

gƒCƒWƒ“ƒOƒXƒsƒ“ƒ‚ƒfƒ‹‚É‚æ‚éƒGƒlƒ‹ƒM[Žû‘©“®ì‚ð—p‚¢‚½Å“K‚ÈŽÀŒ±§Œäƒpƒ‰ƒ[ƒ^Œˆ’èŽè–@‚ÌŒŸ“¢h

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-E206-11A2017”Nt‹GA_“Þì

 

Šâ“c˜Ð”nA‰Á“¡–Ø—IAÀ‘qŒ›•jAŽðˆä³‘¾˜YA”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚ð—p‚¢‚½FCE–@‚É‚æ‚éAuŒ´ŽqÚ‡‚ł̧Œäƒpƒ‰ƒ[ƒ^‚ÌŽ©—¥Ý’èŽè–@h

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA15p-P5-2A2017”Nt‹GA_“Þì

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

g’e“¹“dŽq‚Ì‹ßÚÆŽË‚É‚æ‚éIV‘°”¼“±‘Ì”––Œ‚̃vƒŠƒ“ƒeƒBƒ“ƒO‘ÍÏh

‘æ64‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-E206-6A2017”Nt‹GA_“Þì

 

–ØŒ´—T‰îAˆÉ“¡ŒõŽ÷AâV“¡F¬A‰–‘º^KAŽðˆä³‘¾˜YA”’Š~~ˆê

gŽ©‘RŽû‘©“®ì‚ð—˜—p‚µ‚½ƒCƒWƒ“ƒOƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‹Zp‚ÌŠJ”­‚ÆFPGA‚Ö‚ÌŽÀ‘•h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2017”N2ŒŽ24“úA–kŠC“¹

 

‰–‘º^KAâV“¡F¬AˆÉ“¡ŒõŽ÷A–ØŒ´—T‰îAŽðˆä³‘¾˜YA”’Š~~ˆê

g˜_—ƒQ[ƒg‚Å•\Œ»‚³‚ꂽ2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚Ì‘g‡‚¹Å“K‰»–â‘è‚Ö‚Ì“K—ph

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2017”N2ŒŽ24“úA–kŠC“¹

 

Žðˆä³‘¾˜YA‰–‘º^KAâV“¡F¬A–ØŒ´—T‰îA”’Š~~ˆê

g˜_—•\Œ»‚³‚ꂽ2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚ÌFPGA‚É‚æ‚é‚‘¬‰‰ŽZh

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-C42-6A2016”NH‹GAVŠƒ

 

‰–‘º^KAâV“¡F¬A–ØŒ´—T‰îA”’Š~~ˆê

gƒXƒsƒ“”z—ñ‚ð—˜—p‚µ‚½ƒAƒ‹ƒSƒŠƒYƒ€‚É‚æ‚éƒOƒ‰ƒtÊF–â‘è‚ÌŒŸ“¢h

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-C42-7A2016”NH‹GAVŠƒ

 

–ØŒ´—T‰îAâV“¡F¬AˆÉ“¡ŒõŽ÷A‰–‘º^KA”’Š~~ˆê

gƒCƒWƒ“ƒOƒXƒsƒ“ƒ‚ƒfƒ‹‚ÌŽ©‘RŽû‘©“®ì‚ւ̃}ƒbƒsƒ“ƒO‚É‚æ‚鄉ñƒZ[ƒ‹ƒXƒ}ƒ“–â‘è‚ÌŒŸ“¢h

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-C42-8A2016”NH‹GAVŠƒ

 

ˆÉ“¡’q”VAˆäã˜a‹MA–ØŒ´—T‰îA‰ª“cŒ›VAâV“¡F¬A”’Š~~ˆê

gAuƒiƒmƒMƒƒƒbƒv‚ł̃}ƒCƒOƒŒ[ƒVƒ‡ƒ“§Œä‚É‚æ‚éƒMƒƒƒbƒv‹·ó‰»‚ƃgƒ“ƒlƒ‹’ïR“Á«h

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13p-C42-1A2016”NH‹GAVŠƒ

 

ˆäã˜a‹MAˆÉ“¡’q”VA–ØŒ´—T‰îA‰ª“cŒ›VAâV“¡F¬A”’Š~~ˆê

g‘å‹CŠÂ‹«‰º‚ł̃}ƒCƒOƒŒ[ƒVƒ‡ƒ“§Œä‚É‚æ‚éAuƒiƒmƒMƒƒƒbƒv‚Ì’Ê“d‹·ó‰»h

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13p-C42-2A2016”NH‹GAVŠƒ

 

Šâ“c˜Ð”nAÀ‘qŒ›•jA²“¡G—ºA”’Š~~ˆê

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‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13p-C42-5A2016”NH‹GAVŠƒ

 

À‘qŒ›•jA–ØŒ´—T‰îA‰–‘º^KA‰Á“¡–Ø—IA²“¡G—ºA”’Š~~ˆê

g§Œäƒpƒ‰ƒ[ƒ^‚ÌŽ©—¥“I‚ÈÝ’èŽè–@‚ðŽæ‚è“ü‚ꂽƒŠƒAƒ‹ƒ^ƒCƒ€OS‹ì“®Œ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ÌŒŸ“¢h

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13p-C42-6A2016”NH‹GAVŠƒ

 

Takanari Saito, Yusuke Kihara, Masayuki Shiomura and Jun-ichi Shirakashi

"A New Computing Architecture Using Ising Spin Model for Solving Combinatorial Optimization Problems Implemented on FPGA"

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA14p-C41-16A2016”NH‹GAVŠƒ

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

gƒiƒmƒVƒŠƒRƒ“’e“¹“dŽqŒ¹‚ð—˜—p‚µ‚½IV‘°”¼“±‘Ì”––Œ‚̃vƒŠƒ“ƒeƒBƒ“ƒO‘ÍÏh

‘æ77‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA16a-B10-7A2016”NH‹GAVŠƒ

 

2015”N“x (FY 2015)

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‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21a-S323-3A2016”Nt‹GA“Œ‹ž

 

‰–‘º^KAâV“¡F¬A–ØŒ´—T‰îA”’Š~~ˆê

g˜_—ƒQ[ƒg‚Å•\Œ»‚³‚ꂽ2ŽŸŒ³ƒCƒWƒ“ƒOŒvŽZ‹@‚É‚æ‚é‘g‡‚¹Å“K‰»–â‘è‚ÌŒŸ“¢h

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21a-S323-4A2016”Nt‹GA“Œ‹ž

 

ˆäã˜a‹MAˆÉ“¡’q”VA‰ª“cŒ›VA‘êìŽåŠìAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g’¼—ñÚ‘±Œ^ƒiƒmƒMƒƒƒbƒv‚ł̃}ƒCƒOƒŒ[ƒVƒ‡ƒ“§Œä‚É‚æ‚Á‚Ä컂³‚ꂽ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^h

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21p-S323-4A2016”Nt‹GA“Œ‹ž

 

ˆÉ“¡’q”VAˆÉ“¡ŒõŽ÷A‘êìŽåŠìA‰ª“cŒ›VAˆäã˜a‹MA”’Š~~ˆê

g’ቷ‰º‚Å‚Ì’Ê“d‚É‚æ‚éƒiƒmƒMƒƒƒbƒvŒn’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì컂ƓÁ«§Œäh

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21p-S323-5A2016”Nt‹GA“Œ‹ž

 

‹àŠÛ—S^A‰Á“¡–Ø—IA‰–‘º^KA”’Š~~ˆê

gFPGA‚É‚æ‚éEMƒJƒXƒ^ƒ€ƒn[ƒhƒEƒFƒA‚ð—p‚¢‚½AuƒiƒmƒƒCƒ„‚Ì‹·ó‰»‚ƃRƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä“Á«h

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21p-S323-6A2016”Nt‹GA“Œ‹ž

 

À‘qŒ›•jA²“¡G—ºA‹àŠÛ—S^A”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚ð—p‚¢‚½ŽžŠÔŠm’è“I‚È’Ê“d‚É‚æ‚éAuƒiƒmƒƒCƒ„‚̃Rƒ“ƒ_ƒNƒ^ƒ“ƒX‚Ì‘‰Á§Œäh

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21p-S323-7A2016”Nt‹GA“Œ‹ž

 

âV“¡F¬A–ØŒ´—T‰îA”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg‚ð—p‚¢‚½ƒEƒFƒAƒ‰ƒuƒ‹˜cƒZƒ“ƒT‚É‚æ‚éŠyŠí‰‰‘tƒ‚ƒjƒ^ƒŠƒ“ƒOh

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA21p-W351-4A2016”Nt‹GA“Œ‹ž

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

g’e“¹“dŽq‚ÌŠÒŒ³Œø‰Ê‚ð—˜—p‚µ‚½Cu”––Œ‚̃vƒŠƒ“ƒeƒBƒ“ƒO‘ÍÏh

‘æ63‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA19p-S423-5A2016”Nt‹GA“Œ‹ž

 

ˆÉ“¡ŒõŽ÷AâV“¡F¬A”’Š~~ˆê

gƒiƒ`ƒ…ƒ‰ƒ‹ƒRƒ“ƒsƒ…[ƒeƒBƒ“ƒO‚ð—p‚¢‚½VŒ^ŒvŽZ‹@‚ÌŠJ”­h

“Œ‹ž”_H‘åŠwA“d‹C’ÊM‘åŠwA“Œ‹žŠO‘Œê‘åŠw@‘½–€’n‹æ‡“¯ƒRƒƒLƒEƒ€ |Šw‰ÈA‘åŠw‚ð‰z‚¦‚Ĉٕª–ìŠÔ‚̌𗬂ð[‚߂悤|A#29A2015”N10ŒŽ31“ú-11ŒŽ1“úA”ª‰¤ŽqƒZƒ~ƒi[ƒnƒEƒX

 

–ØŒ´—T‰îAâV“¡F¬A‰º“cŠ°A”’Š~~ˆê

gƒOƒ‰ƒtƒ@ƒCƒg˜cƒZƒ“ƒT‚ð—p‚¢‚½ƒEƒFƒAƒ‰ƒuƒ‹ƒfƒoƒCƒX‚É‚æ‚él‘Ì“®ì‚ÌŠÏŽ@h

‘æ76‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-4F-1A2015”NH‹GA–¼ŒÃ‰®

 

âV“¡F¬A‰º“cŠ°A–ØŒ´—T‰îA”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg×ü‚̌ċzŒŸ’mƒZƒ“ƒT‚ւ̉ž—ph

‘æ76‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-4F-4A2015”NH‹GA–¼ŒÃ‰®

 

âV“¡F¬A‰º“cŠ°A–ØŒ´—T‰îA”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg×ü‚ð—p‚¢‚½˜cƒZƒ“ƒT‚É‚æ‚é–¬”gŠÏŽ@h

‘æ76‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA13a-4F-9A2015”NH‹GA–¼ŒÃ‰®

 

‰ª“cŒ›VA‰Á£«AˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gWω»ƒiƒmƒMƒƒƒbƒv‚Ö‚Ì’Ê“d‚É‚æ‚é“d‹C“I“Á«§Œä‚Æ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚̈ꊇì»h

‘æ76‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA16a-4A-5A2015”NH‹GA–¼ŒÃ‰®

 

²“¡G—ºA‹àŠÛ—S^A‰Á“¡–Ø—IA”’Š~~ˆê

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‘æ76‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA16a-4A-7A2015”NH‹GA–¼ŒÃ‰®

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

g’e“¹“dŽq‚Ì‹ßÚÆŽË‚É‚æ‚é Cu ”––Œ‚̃vƒŠƒ“ƒeƒBƒ“ƒO‘ÍÏh

‘æ76‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-1C-7A2015”NH‹GA–¼ŒÃ‰®

 

2014”N“x (FY 2014)

”ª–Ø–ƒŽÀŽqAâV“¡F¬A”’Š~~ˆê

gAuƒiƒmƒ`ƒƒƒlƒ‹‚̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚鎿—Ê—A‘—‰ß’ö‚ÌIn-Situ AFMŠÏŽ@h

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-A29-3A2015”Nt‹GA_“Þì

 

‰º“cŠ°AâV“¡F¬A”’Š~~ˆê

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‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-D4-1A2015”Nt‹GA_“Þì

 

âV“¡F¬A‰º“cŠ°A”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg×ü‚ð—p‚¢‚½‘•’…Œ^ƒfƒoƒCƒX‚É‚æ‚él‘Ì“®ì‚ÌŠÏŽ@h

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-D4-2A2015”Nt‹GA_“Þì

 

²“¡G—ºA‹àŠÛ—S^A‰Á“¡–Ø—IA”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚ð—p‚¢‚½FCE–@‚É‚æ‚éAuƒiƒmƒƒCƒ„‚Ì‚¸“xƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“§Œä‚É‚æ‚é‹·ó‰»h

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14a-A20-9A2015”Nt‹GA_“Þì

 

‰Á“¡–Ø—IA‹àŠÛ—S^A²“¡G—ºA”’Š~~ˆê

gFPGA‚ð—p‚¢‚½‚‘¬ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚éAuƒiƒmƒƒCƒ„‚Ì‹·ó‰»‚ƃRƒ“ƒ_ƒNƒ^ƒ“ƒX‚̧Œäh

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14a-A20-10A2015”Nt‹GA_“Þì

 

‰Á£«AXŒ´N•½A‰ª“cŒ›VA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚ð—˜—p‚µ‚½’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì컂Ɠd‹C“I“Á«‚ÌŒŸ“¢h

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A20-1A2015”Nt‹GA_“Þì

 

‰ª“cŒ›VAXŒ´N•½A‰Á£«AˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g’¼—ñ‚ÉÚ‘±‚³‚ꂽƒiƒmƒMƒƒƒbƒv‚Å‚Ì’Ê“d‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì“¯ŽžˆêŠ‡ì»h

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA14p-A20-2A2015”Nt‹GA_“Þì

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾AR. MentekA”’Š~~ˆêA‰z“cM‹`

gƒiƒmƒVƒŠƒRƒ“’e“¹“dŽqŒ¹‚ð—p‚¢‚½Cu”––Œ‚̃vƒŠƒ“ƒeƒBƒ“ƒO‘ÍÏh

‘æ62‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA11a-A29-4A2015”Nt‹GA_“Þì

 

XŒ´N•½A”’Š~~ˆê iHŠw•”EHŠw•{Šw¶‚É‚æ‚錤‹†”­•\‰ïiƒ|ƒXƒ^[”­•\‰ïj —DGƒ|ƒXƒ^[Üj

gŒ´Žq‚â“dŽq‚̧Œä‚É‚æ‚éV‚µ‚¢ƒGƒŒƒNƒgƒƒjƒNƒX‚Ì\’z‚ð–ÚŽw‚µ‚Ä@`V‚µ‚¢ƒRƒ“ƒsƒ…[ƒ^‚ðì‚邽‚ß‚ÌŒ¤‹†‚Å‚·`h

“Œ‹ž”_H‘åŠw@HŠw•”EHŠw•{Šw¶‚É‚æ‚錤‹†”­•\‰ïiƒ|ƒXƒ^[”­•\‰ïjA#28A2014”N11ŒŽ8“úA“Œ‹ž”_H‘åŠw‰ÈŠw”Ž•¨ŠÙ

 

XŒ´N•½A‰Á£«A”’Š~~ˆê

gŒ´Žq‚â“dŽq‚̧Œä‚É‚æ‚éƒiƒmƒXƒP[ƒ‹ƒGƒŒƒNƒgƒƒjƒNƒX‚Ì\’zh

“Œ‹ž”_H‘åŠwA“d‹C’ÊM‘åŠwA“Œ‹žŠO‘Œê‘åŠw@‘½–€’n‹æ‡“¯ƒRƒƒLƒEƒ€ |Šw‰ÈA‘åŠw‚ð‰z‚¦‚Ĉٕª–ìŠÔ‚̌𗬂ð[‚߂悤|A#30A2014”N11ŒŽ1-2“úA‘½–€‰iŽRî•ñ‹³ˆçƒZƒ“ƒ^[

 

‘êìŽåŠìAˆÉ“¡ŒõŽ÷AXŒ´N•½A–L’†‹M‘åA”’Š~~ˆê

gNiƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½’Ê“d‚É‚æ‚é’ïRƒXƒCƒbƒ`ƒ“ƒOŒø‰Ê‚Ì“®ìƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-A7-9A2014”NH‹GA–kŠC“¹

 

”ª–Ø–ƒŽÀŽqAâV“¡F¬A”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½Auƒiƒmƒ`ƒƒƒlƒ‹‚̃Rƒ“ƒ_ƒNƒ^ƒ“ƒX§Œä‚ÆMass Transport‚ÌAFMŽÀŽžŠÔŠÏŽ@h

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-A7-10A2014”NH‹GA–kŠC“¹

 

‹àŠÛ—S^A–”‹g”ü²Ž}A”’Š~~ˆê

gFPGA‚ð—p‚¢‚½ƒJƒXƒ^ƒ€ƒn[ƒhƒEƒFƒA‚É‚æ‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚̃}ƒCƒNƒ•b§Œäh

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-A7-11A2014”NH‹GA–kŠC“¹

 

âV“¡F¬A–”‹g”ü²Ž}A”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg‚ð—p‚¢‚½–Êóƒq[ƒ^‚Ì”­”M‰·“xŠÏŽ@h

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-A7-12A2014”NH‹GA–kŠC“¹

 

–”‹g”ü²Ž}AâV“¡F¬A”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg×ü‚Ì“d‹C“`“±“Á«‚ɑ΂·‚é•ÏŒ`‚ÌŒø‰Êh

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-A7-13A2014”NH‹GA–kŠC“¹

 

”ª–Ø–ƒŽÀŽqA{“c—²‘¾˜YA¬“‡–¾AR. MentekA”’Š~~ˆêA‰z“cM‹`

gƒiƒmƒVƒŠƒRƒ“’e“¹“dŽqŒ¹‚ð—p‚¢‚½IV‘°”¼“±‘Ì”––Œ‚Ì‘ÍÏh

‘æ75‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19a-A19-10A2014”NH‹GA–kŠC“¹

 

2013”N“x (FY 2013)

–”‹g”ü²Ž}A{“c—²‘¾˜YA”’Š~~ˆê

g”––ŒƒOƒ‰ƒtƒ@ƒCƒg×ü‚Ì’Ê“dŽž‰·“xƒCƒ[ƒWƒ“ƒOh

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F11-1A2014”Nt‹GA_“Þì

 

‘êìŽåŠìA{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AXŒ´N•½A–L’†‹M‘åA”’Š~~ˆê

gNiƒiƒmƒMƒƒƒbƒv‚É‚¨‚¯‚é’ïRƒXƒCƒbƒ`ƒ“ƒOŒø‰Êh

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F11-11A2014”Nt‹GA_“Þì

 

–L’†‹M‘åA{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AXŒ´N•½A‘êìŽåŠìA”’Š~~ˆê

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‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F11-12A2014”Nt‹GA_“Þì

 

‹àŠÛ—S^AˆÀ“¡¹ŸA{“c—²‘¾˜YA”’Š~~ˆê

gFPGA‚ð—p‚¢‚½ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚Ì’´‚‘¬Œv‘ª§Œäh

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F11-13A2014”Nt‹GA_“Þì

 

ˆÀ“¡¹ŸA‹àŠÛ—S^A{“c—²‘¾˜YA”’Š~~ˆê

gRTOS‚ð—p‚¢‚½Œv‘ª§ŒäƒVƒXƒeƒ€‚É‚æ‚éAuƒiƒmƒƒCƒ„‚ÌŽžŠÔŠm’èŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ““Á«h

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA17p-F11-14A2014”Nt‹GA_“Þì

 

{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AXŒ´N•½A–L’†‹M‘åA‘êìŽåŠìA”’Š~~ˆê i2014”N‘æ61 ‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïPoster Awardj

gƒiƒmƒMƒƒƒbƒv‚ð—˜—p‚µ‚½—ÊŽqƒ|ƒCƒ“ƒgƒRƒ“ƒ^ƒNƒg‚ÌŒ`¬‚ƧŒäh

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18p-PG10-4A2014”Nt‹GA_“Þì

 

ˆÉ“¡ŒõŽ÷A{“c—²‘¾˜YAXŒ´N•½A–L’†‹M‘åA‘êìŽåŠìA”’Š~~ˆê

g’¼•À—ñÚ‘±Œ^ƒiƒmƒMƒƒƒbƒv‚Å‚Ì’Ê“d‹·ó‚É‚¨‚¯‚é\‘¢§Œäƒpƒ‰ƒ[ƒ^‚ɂ‚¢‚Ä‚ÌŒŸ“¢h

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XŒ´N•½AˆÉ“¡ŒõŽ÷A{“c—²‘¾˜YA–L’†‹M‘åA‘êìŽåŠìA”’Š~~ˆê

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‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18p-PG10-6A2014”Nt‹GA_“Þì

 

”ª–Ø–ƒŽÀŽqA{“c—²‘¾˜YAâV“¡F¬A”’Š~~ˆê@

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{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA¬“‡–¾ARomain MentekA”’Š~~ˆêA‰z“cM‹`

gƒiƒmƒVƒŠƒRƒ“’e“¹“dŽqŒ¹‚ð—p‚¢‚½Si, Ge, SiGe”––Œ‚Ì‘ÍÏh

‘æ61‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA18p-E14-20A2014”Nt‹GA_“Þì

 

ˆÀ“¡¹ŸA‹àŠÛ—S^AâV“¡F¬A”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚É‚æ‚鎞ŠÔŠm’èŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“§ŒäƒVƒXƒeƒ€h

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‹àŠÛ—S^AˆÀ“¡¹ŸAâV“¡F¬A”’Š~~ˆê

gFPGA‚ð—p‚¢‚½’´‚‘¬ƒtƒB[ƒhƒoƒbƒN§ŒäŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2014”N2ŒŽ27“ú-28“úA–kŠC“¹

 

{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AXŒ´N•½A–L’†‹M‘åA‘êìŽåŠìA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚Å‚ÌŒ´Žq‚̃}ƒCƒOƒŒ[ƒVƒ‡ƒ“Œ»Û‚É‚æ‚è컂µ‚½NiŒnƒiƒmƒXƒP[ƒ‹ƒfƒoƒCƒXh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2014”N2ŒŽ27“ú-28“úA–kŠC“¹

 

{“c—²‘¾˜YAXŒ´N•½A‘êìŽåŠìA”’Š~~ˆê

gNiŒnƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½‹­Ž¥«’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ìì»h

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20a-C11-7A2013”NH‹GA‹ž“s

 

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g“dˆ³§ŒäŒ^ƒtƒB[ƒhƒoƒbƒN’Ê“d‰ß’ö‚É‚¨‚¯‚éƒOƒ‰ƒtƒFƒ“‚ÌCCD‹ßÔŠOüƒCƒ[ƒWƒ“ƒO‚É‚æ‚é‚»‚Ìꉷ“x‘ª’èh

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA20a-C11-9A2013”NH‹GA‹ž“s

 

ˆÀ“¡¹ŸAâV“¡F¬A‹àŠÛ—S^A”’Š~~ˆê

gƒŠƒAƒ‹ƒ^ƒCƒ€OS‚É‚æ‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“§ŒäƒVƒXƒeƒ€‚Ì‹à‘®×üƒ`ƒƒƒlƒ‹‚Ö‚Ì“K—ph

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XŒ´N•½A{“c—²‘¾˜YA‘êìŽåŠìA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒvŒn’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì컂ɂ¨‚¯‚é“d‹ÉŒ`ó‚ÌŒŸ“¢h

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-P3-2A2013”NH‹GA‹ž“s

 

–L’†‹M‘åAˆÉ“¡ŒõŽ÷A•½“cW‘åA”’Š~~ˆê

g’Ê“d‚É‚æ‚錴ŽqˆÚ“®§ŒäŽè–@‚Ì’¼•À—ñÚ‘±Œ^ƒiƒmƒMƒƒƒbƒv‚Ö‚Ì“K—ph

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-P3-3A2013”NH‹GA‹ž“s

 

•½“cW‘åAˆÉ“¡ŒõŽ÷A–L’†‹M‘åA”’Š~~ˆê

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‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-P3-4A2013”NH‹GA‹ž“s

 

”ª–Ø–ƒŽÀŽqA{“c—²‘¾˜YAâV“¡F¬A”’Š~~ˆê

gŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚É‚æ‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚Ì‚»‚ÌêŠÏŽ@h

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-P3-5A2013”NH‹GA‹ž“s

 

ˆÉ“¡ŒõŽ÷A•½“cW‘åA–L’†‹M‘åA”’Š~~ˆê

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‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19p-P3-6A2013”NH‹GA‹ž“s

 

”ª–Ø–ƒŽÀŽqAˆÉ“¡ŒõŽ÷A{“c—²‘¾˜YA¬“‡–¾AR. MentekA”’Š~~ˆêA‰z“cM‹`

g’e“¹“dŽq‚Ì’¼ÚŠÒŒ³Œø‰Ê‚ð—p‚¢‚½”¼“±‘Ì”––Œ‘ÍÏh

‘æ74‰ñ‰ž—p•¨—Šw‰ïH‹GŠwpu‰‰‰ïA19a-P5-9A2013”NH‹GA‹ž“s

 

2012”N“x (FY 2012)

•½“cW‘åA{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AΈ䑈êA”’Š~~ˆê

gWω»ƒiƒmƒMƒƒƒbƒv‚ł̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é”nm‹‰ƒMƒƒƒbƒv§Œä‚ÌŒŸ“¢h

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA28p-B9-9A2013”Nt‹GA_“Þì

 

HŒ³r‰îA{“c—²‘¾˜YAˆÀ“¡¹ŸAXŒ´N•½A”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒvŒn’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì컂ɂ¨‚¯‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚Ì“K—p‰ñ”‚ÌŒŸ“¢h

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA28p-B9-10A2013”Nt‹GA_“Þì

 

{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷A¬“‡–¾A”’Š~~ˆêA‰z“cM‹`

gƒiƒmƒVƒŠƒRƒ“’e“¹“dŽqŒ¹‚ÌŠÒŒ³Œø‰Ê‚É‚æ‚éSi”––Œ‘ÍÏh

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA28p-G6-6A2013”Nt‹GA_“Þì

 

Έ䑈êA{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷A•½“cW‘åA”’Š~~ˆê

g’¼—ñÚ‘±Œ^Wω»ƒiƒmƒMƒƒƒbƒv‚ł̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½‹·ó‰ß’ö‚É‚¨‚¯‚é“d‹C“I“Á«‚̧Œäh

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA29a-PB3-6A2013”Nt‹GA_“Þì

 

‹g“c‘ìA{“c—²‘¾˜YAâV“¡F¬AAmpere. A. TsengA”’Š~~ˆê

gƒOƒ‰ƒtƒFƒ“‚ɑ΂·‚éSPMƒXƒNƒ‰ƒbƒ`‰ÁH‚Ì’Tj‘–¸ðŒ‚ÌŒŸ“¢h

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA29a-PB3-7A2013”Nt‹GA_“Þì

 

{“c—²‘¾˜YAâV“¡F¬A‹g“c‘ìAAmpere. A. TsengA”’Š~~ˆê

gSPM’Tj‚ð—p‚¢‚½‹@ŠB“IŽè–@‚É‚æ‚éƒOƒ‰ƒtƒFƒ“‚Ì•\–ʈ—h

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA29a-PB3-8A2013”Nt‹GA_“Þì

 

âV“¡F¬AŒú•ê‘§A{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gCCD‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚éƒOƒ‰ƒtƒFƒ“‚Ì’Ê“d‰ß’ö‚É‚¨‚¯‚é‚»‚Ìꉷ“x‘ª’èh

‘æ60‰ñ‰ž—p•¨—Šw‰ït‹GŠwpu‰‰‰ïA29a-PB3-9A2013”Nt‹GA_“Þì

 

{“c—²‘¾˜YAâV“¡F¬A‹g“c‘ìAAmpere A. TsengA”’Š~~ˆê

gSPMƒXƒNƒ‰ƒbƒ`–@‚ð—p‚¢‚½ƒiƒmƒXƒP[ƒ‹‰ÁH‚̃Oƒ‰ƒtƒFƒ“‚Ö‚Ì“K—ph

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2013”N2ŒŽ27“ú-28“úA–kŠC“¹

 

âV“¡F¬AŒú•ê‘§A{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒWƒ…[ƒ‹‰Á”M‚³‚ꂽƒOƒ‰ƒtƒFƒ“‚Ì‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚é‚»‚Ìꉷ“x‘ª’èh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2013”N2ŒŽ27“ú-28“úA–kŠC“¹

 

R. Suda, T. Saito, A. A. Tseng and J. Shirakashi (Selected for the Best Poster Award of the Symposium)

"Scanning Probe Microscopy Scratch Nanolithography on Graphene"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ9‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT11A2012”N12ŒŽ15“úA“d‹C’ÊM‘åŠw

 

M. Ito, V. Bouchiat and J. Shirakashi

"Local Oxidation Nanolithography of Graphene Using Scanning Probe Microscopy"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ9‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT25A2012”N12ŒŽ15“úA“d‹C’ÊM‘åŠw

 

–kìA{“c—²‘¾˜YA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚éƒvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡ì»‰ß’ö‚É‚¨‚¯‚éNiƒiƒmƒ`ƒƒƒlƒ‹‚Ì\‘¢§Œä«h

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-8A2012”NH‹GAˆ¤•Q

 

HŒ³r‰îA{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqAˆÀ“¡¹ŸA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒvŒnƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚Å‚Ì‹ì“®“dŒ¹‚ÌŒŸ“¢‚Æ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ìì»h

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-9A2012”NH‹GAˆ¤•Q

 

ˆÀ“¡¹ŸAHŒ³r‰îA{“c—²‘¾˜YA”’Š~~ˆê

gƒtƒB[ƒhƒoƒbƒN§ŒäŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚̃iƒmƒMƒƒƒbƒv‚Ö‚Ì“K—ph

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-10A2012”NH‹GAˆ¤•Q

 

•½“cW‘åA{“c—²‘¾˜YAˆÉ“¡ŒõŽ÷AHŒ³r‰îA”’Š~~ˆê

g’¼—ñÚ‘±Œ^ƒiƒmƒMƒƒƒbƒv‚ւ̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚éƒMƒƒƒbƒvŒ`ó‚Ì“¯ŽžˆêŠ‡§Œäh

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-11A2012”NH‹GAˆ¤•Q

 

{“c—²‘¾˜YAâV“¡F¬A”’Š~~ˆê

gSPMƒXƒNƒ‰ƒbƒ`ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[‚É‚æ‚éƒOƒ‰ƒtƒFƒ“‚̉ÁH“Á«h

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-12A2012”NH‹GAˆ¤•Q

 

âV“¡F¬AWeichih LinAŒKŒ´—m‰îA”’Š~~ˆê

gCCD‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚éƒ}ƒCƒNƒƒq[ƒ^‚̉·“x‘ª’èh

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-13A2012”NH‹GAˆ¤•Q

 

Œú•ê‘§AâV“¡F¬A”’Š~~ˆê

g’Ê“d‰ß’ö‚É‚¨‚¯‚éƒOƒ‰ƒtƒ@ƒCƒg‚Ì‹ßÔŠOŠÏŽ@‚Æ•\–Ê\‘¢•Ï‰»‚ÌŒŸ“¢h

‘æ73‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA12p-PA5-14A2012”NH‹GAˆ¤•Q

 

{“c—²‘¾˜YA”’Š~~ˆê

"Control of Atomic-Scale Structures Using Electrically and Physically Regulated Methods for Fabrication of Nanoscale Devices"

”_H‘奓d’ʑ凓¯‡hƒRƒƒLƒEƒ€ |“Ë”j—Í‚Ì—{¬F ˆÙ•ª–ìŠÔ‚ł̃Rƒ~ƒ…ƒjƒP[ƒVƒ‡ƒ“—Í|AD6A2012”N9ŒŽ8-9“úA‘½–€‰iŽRî•ñ‹³ˆçƒZƒ“ƒ^[

 

”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

"Investigation of Nanogap Formation Process Using Field-Emission-Induced Electromigration with Alternating Current Bias"

”_H‘奓d’ʑ凓¯‡hƒRƒƒLƒEƒ€ |“Ë”j—Í‚Ì—{¬F ˆÙ•ª–ìŠÔ‚ł̃Rƒ~ƒ…ƒjƒP[ƒVƒ‡ƒ“—Í|AB2A2012”N9ŒŽ8-9“úA‘½–€‰iŽRî•ñ‹³ˆçƒZƒ“ƒ^[

 

2011”N“x (FY 2011)

–kìA{“c—²‘¾˜YA”’Š~~ˆê

gNi—ÊŽqƒ|ƒCƒ“ƒgƒRƒ“ƒ^ƒNƒg‚É‚¨‚¯‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“isƒƒJƒjƒYƒ€‚ÌŒŸ“¢h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-1A2012”Nt‹GA“Œ‹ž

 

{“c—²‘¾˜YA–kìA”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚©‚ç—ÊŽqƒ|ƒCƒ“ƒgƒRƒ“ƒ^ƒNƒg‚Ö‚Ì\‘¢‘JˆÚ‰ß’ö‚ÌŒŸ“¢h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-2A2012”Nt‹GA“Œ‹ž

 

”ª–Ø–ƒŽÀŽqAHŒ³r‰îAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—˜—p‚µ‚½ŒðŒÝ’Ê“dŽè–@‚É‚æ‚éƒiƒmƒMƒƒƒbƒv‹·ó‰ß’ö‚ÌŠÏŽ@h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-3A2012”Nt‹GA“Œ‹ž

 

ˆÉ“¡ŒõŽ÷AHŒ³r‰îA”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—˜—p‚µ‚½ŒðŒÝ’Ê“dŽè–@‚É‚æ‚é’¼—ñŒ^ƒiƒmƒMƒƒƒbƒv‚̈ꊇ‹·ó‰»§Œäh

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-4A2012”Nt‹GA“Œ‹ž

 

ˆÀ“¡¹ŸAHŒ³r‰îA{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ł̃iƒmƒMƒƒƒbƒv‹·ó‰ß’ö‚É‚¨‚¯‚éƒiƒmƒMƒƒƒbƒv’ïR‚̕ω»‚ð—˜—p‚µ‚½’Ê“d§Œä–@‚ÌŒŸ“¢h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-5A2012”Nt‹GA“Œ‹ž

 

HŒ³r‰îAˆÉ“¡ŒõŽ÷A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚É‚¨‚¯‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚Ìis‚É”º‚¤’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^“Á«‚ÌŒŸ“¢h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA15a-B3-6A2012”Nt‹GA“Œ‹ž

 

âV“¡F¬AŒú•ê‘§A‘åŽR—²GA”’Š~~ˆê

gŒõŠw“IŽè–@‚Æ–€ŽC—ÍŒ°”÷–@‚ð‘g‚݇‚킹‚½ƒOƒ‰ƒtƒFƒ“‚ÌŠÏŽ@h

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA16a-B2-8A2012”Nt‹GA“Œ‹ž

 

‘åŽR—²GA{“c—²‘¾˜YAŒú•ê‘§AâV“¡F¬A”’Š~~ˆê

gŠî”Âã‚É“]ŽÊ‚µ‚½ƒOƒ‰ƒtƒFƒ“‚ɑ΂·‚éSPMƒXƒNƒ‰ƒbƒ`ƒŠƒ\ƒOƒ‰ƒtƒB[‚Ì“K—ph

‘æ59‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA16a-B2-9A2012”Nt‹GA“Œ‹ž

 

{“c—²‘¾˜YA‘åŽR—²GA”’Š~~ˆê i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB •½¬24”N“dŽqƒfƒoƒCƒXŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

gSPMƒXƒNƒ‰ƒbƒ`‰ÁH‚ð—p‚¢‚½‹à‘®ƒ`ƒƒƒlƒ‹‹·ó‰ß’ö‚É‚¨‚¯‚éƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚Ì—ÊŽq‰»h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2012”N2ŒŽ7“ú-8“úA–kŠC“¹

 

ˆÉ“¡ŒõŽ÷AHŒ³r‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚ð—p‚¢‚½’¼—ñŒ^ƒiƒmƒMƒƒƒbƒv‚ÌWω»‚Æ“Á«§Œäh

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2012”N2ŒŽ7“ú-8“úA–kŠC“¹

 

M. Ito, S. Akimoto and J. Shirakashi

"Integrated Nanogaps Simultaneously Tuned by Field-Emission-Induced Electromigration"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ8‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT22A2011”N12ŒŽ10“úA“Œ‹ž”_H‘åŠw

 

R. Suda, M. Yagi and J. Shirakashi

"Quantum Point Contacts Fabricated by Field-Emission-Induced Electromigration"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ8‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT24A2011”N12ŒŽ10“úA“Œ‹ž”_H‘åŠw

 

Œú•ê‘§AâV“¡F¬A”’Š~~ˆê

gCCD‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚éƒOƒ‰ƒtƒ@ƒCƒg‚Ì’Ê“d‰ß’ö‚É‚¨‚¯‚é”­”M‰·“x‘ª’è‚ÆÁ”ï“d—Í‚ÌŒŸ“¢h

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-E-10A2011”NH‹GAŽRŒ`

 

”ª–Ø–ƒŽÀŽqA{“c—²‘¾˜YA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—˜—p‚µ‚½ŒðŒÝ’Ê“dŽè–@‚É‚æ‚éƒiƒmƒMƒƒƒbƒv\‘¢Œ`¬‚ÌŒŸ“¢h

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-7A2011”NH‹GAŽRŒ`

 

{“c—²‘¾˜YA”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½ƒiƒmƒMƒƒƒbƒv‹·ó‰ß’ö‚É‚¨‚¯‚éƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚Ì—ÊŽq‰»h

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-8A2011”NH‹GAŽRŒ`

 

ˆÉ“¡ŒõŽ÷AHŒ³r‰îA”’Š~~ˆê

g’Ê“d‚É‚æ‚錴ŽqˆÚ“®§ŒäŽè–@‚Ì’¼—ñŒ^ƒiƒmƒMƒƒƒbƒv‚Ö‚Ì“K—ph

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-9A2011”NH‹GAŽRŒ`

 

•½“cW‘åAˆÉ“¡ŒõŽ÷AHŒ³r‰îA”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚©‚çƒiƒmƒƒCƒ„‚Ö‚Ì\‘¢•ÏŠ·§Œäh

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-10A2011”NH‹GAŽRŒ`

 

HŒ³r‰îAˆÉ“¡ŒõŽ÷A”’Š~~ˆê

gƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^컋Zp‚ÌŒŸ“¢h

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-11A2011”NH‹GAŽRŒ`

 

–kìAŒú•ê‘§A”’Š~~ˆê

gƒvƒŒƒi[Œ^ƒ`ƒƒƒlƒ‹‚É‚¨‚¯‚éƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½\‘¢§Œä‚ÌŒŸ“¢h

‘æ72‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA1a-ZQ-12A2011”NH‹GAŽRŒ`

 

2010”N“x (FY 2010)

ŒKŒ´—m‰îA¼‘ºM–çAŒú•ê‘§A”’Š~~ˆê

gƒOƒ‰ƒtƒ@ƒCƒg‚Ì‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚Æ‚»‚Ìꉷ“x‘ª’èh

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-8A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

Œú•ê‘§A¼‘ºM–çAŒKŒ´—m‰îA”’Š~~ˆê

g“dˆ³§ŒäŒ^’Ê“d‰ß’ö‚É‚¨‚¯‚éƒOƒ‰ƒtƒ@ƒCƒg‚ÌIn-Situ‹ßÔŠOüƒCƒ[ƒWƒ“ƒO‚É‚æ‚é”­”M‰·“x•ª•z‚ÌŒŸ“¢h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-9A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

–kìAˆÀ•—´‘¾˜NA“n糌h“oAã–ìr‰îA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½Niƒiƒmƒ`ƒƒƒlƒ‹‚Ì’ïR§Œäis‰ß’ö‚Ì•]‰¿h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-10A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

”ª–Ø–ƒŽÀŽqA“n糌h“oAã–ìr‰îA‘ê’J˜a‘A{“c—²‘¾˜YA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éƒiƒmƒMƒƒƒbƒv컂ɂ¨‚¯‚éŒðŒÝ’Ê“dŽè–@‚ÌŒŸ“¢h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-11A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

ˆÉ“¡ŒõŽ÷Aã–ìr‰îA“n糌h“oA‘ê’J˜a‘AHŒ³r‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éWω»ƒiƒmƒMƒƒƒbƒv‚Å‚Ì“¯Žž“Á«§Œä‚ÌŒŸ“¢h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-12A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

{“c—²‘¾˜YA“n糌h“oAã–ìr‰îA‘ê’J˜a‘A”ª–Ø–ƒŽÀŽqA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éNi—ÊŽqƒ|ƒCƒ“ƒgƒRƒ“ƒ^ƒNƒg‚ÌŒ`¬h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-13A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

HŒ³r‰îAã–ìr‰îA“n糌h“oA‘ê’J˜a‘AˆÉ“¡ŒõŽ÷A”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ìì»ðŒ‚Æ“Á«§Œä‚ÌŒŸ“¢h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-KR-14A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

¼‘ºM–çAŒKŒ´—m‰îAŒú•ê‘§A”’Š~~ˆê

gƒfƒBƒXƒNƒŠ[ƒgPNP Si ƒoƒCƒ|[ƒ‰ƒgƒ‰ƒ“ƒWƒXƒ^‚É‚¨‚¯‚鎥‹C’ïRŒø‰Ê‚ÌŠÏ‘ªh

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA25a-KM-12A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

ˆÀ•—´‘¾˜NA“n糌h“oAã–ìr‰îA–kìA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚è컂µ‚½ƒvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‘fŽq‚ÌŽº‰·Ž¥‹C’ïR“Á«h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA25p-KQ-1A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

‹g•y^–çA˜@Œ©^•FA”’Š~~ˆêAŽL“‡r”VA–ì~A“Œ´ˆê˜Y

gŽ_‘fƒvƒ‰ƒYƒ}ˆ—‚Æ‚ˆ³…ö‹C”Mˆ—‚Ì‘g‚݇‚킹‚É‚æ‚éƒVƒŠƒRƒ“•\–ʂ̃pƒbƒVƒx[ƒVƒ‡ƒ“h

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA25p-KW-1A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

¼ì_‘¾ABernard GellozA‰z“cM‹`A”’Š~~ˆê

gƒiƒmƒVƒŠƒRƒ“‚ÌÔFPL‚ÆÂF—ÓŒõ‚ɑ΂·‚éŠO•”“dŠEŒø‰Êh

‘æ58‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA26a-BW-6A2011”Nt‹GA_“Þì@y“Œ“ú–{‘åkЂɂæ‚è’†Ž~z

 

ˆÀ•—´‘¾˜NA“n糌h“oAã–ìr‰îA–kìA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚ð—p‚¢‚½Žº‰·“®ì‰Â”\‚ȃvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‘fŽq‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2011”N2ŒŽ23“ú-24“úA–kŠC“¹

 

S. Nishimura, R. Zaharuddin, Y. Kuwabara and J. Shirakashi

"Magnetoresistance Effects in Discrete Si Transistors"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ7‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT43A2010”N12ŒŽ11“úA“d‹C’ÊM‘åŠw

 

K. Takiya, S. Ueno, T. Watanabe and J. Shirakashi

"Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ7‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT45A2010”N12ŒŽ11“úA“d‹C’ÊM‘åŠw

 

¼‘ºM–çARizal ZaharuddinAŒKŒ´—m‰îA”’Š~~ˆê

gƒfƒBƒXƒNƒŠ[ƒgSiÚ‡Œ^“dŠEŒø‰Êƒgƒ‰ƒ“ƒWƒXƒ^‚É‚¨‚¯‚鎥‹C’ïR‚Ì•Ï’²§Œäh

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA15a-F-7A2010”NH‹GA’·è

 

¼‘ºM–çARizal ZaharuddinAŒKŒ´—m‰îA”’Š~~ˆê

gƒfƒBƒXƒNƒŠ[ƒgSiƒoƒCƒ|[ƒ‰ƒgƒ‰ƒ“ƒWƒXƒ^‚É‚¨‚¯‚鎥‹C’ïRŒø‰Ê‚ÌŠÏ‘ªh

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA15a-F-8A2010”NH‹GA’·è

 

‘ê’J˜a‘Aã–ìr‰îA“n糌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚ł̃iƒmƒMƒƒƒbƒv‹·ó‰»‚É‚¨‚¯‚éÁ”ï“d—Í‚ÌŒŸ“¢h

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-13A2010”NH‹GA’·è

 

‘ê’J˜a‘Aã–ìr‰îA“n糌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚¨‚¯‚é’Ê“dŽè–@‚ÆŒ´ŽqˆÚ“®‹@\‚ÌŠÖŒWh

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-14A2010”NH‹GA’·è

 

“n糌h“oAã–ìr‰îA‘ê’J˜a‘A{“c—²‘¾˜YA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é‹­Ž¥«ƒiƒm\‘¢‚ÌV‹K‚È컎è–@‚ÌŒŸ“¢h

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-15A2010”NH‹GA’·è

 

ˆÉ“¡ŒõŽ÷Aã–ìr‰îA‘ê’J˜a‘A“n糌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚ÌWω»‚Æ“Á«§Œäh

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-16A2010”NH‹GA’·è

 

ŒKŒ´—m‰îA¼‘ºM–çARizal ZaharuddinA”’Š~~ˆê

gƒpƒbƒVƒx[ƒVƒ‡ƒ“ˆ—‚ð‚µ‚½‹à‘®×üƒ`ƒƒƒlƒ‹‚̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‰ß’ö‚É‚¨‚¯‚é”­”M•ª•z‚̉Ž‹‰»h

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-17A2010”NH‹GA’·è

 

ˆÀ•—´‘¾˜NAŒú•ê‘§A“n糌h“oA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚ł̃iƒmƒ`ƒƒƒlƒ‹‹·ó‰ß’ö‚É‚¨‚¯‚éÁ”ï“d—Í‚ÌŒŸ“¢h

‘æ71‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA16p-ZT-18A2010”NH‹GA’·è

 

2009”N“x (FY 2009)

–L•Ÿ‹MŽmA¼‘ºM–çAŒKŒ´—m‰îA”’Š~~ˆê

gSilicon on Insulator (SOI) Šî”‚ł̎¥‹C’ïRŒø‰Ê‚ÌŠÏ‘ªh

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA18a-ZK-9A2010”Nt‹GA_“Þì

 

¼‘ºM–çA–L•Ÿ‹MŽmAŒKŒ´—m‰îA”’Š~~ˆê

gƒfƒBƒXƒNƒŠ[ƒgƒVƒŠƒRƒ“”¼“±‘Ì‚É‚¨‚¯‚鎥‹C’ïRŒø‰Ê‚ÌŠÏ‘ªh

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA18a-ZK-10A2010”Nt‹GA_“Þì

 

ˆÀ•—´‘¾˜NA—F“c—I‰îAˆÉ’O‘sˆê˜YA‹v•Äœ\AŒú•ê‘§A”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚É‚æ‚éƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‰ß’ö‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-4A2010”Nt‹GA_“Þì

 

Œú•ê‘§A—F“c—I‰îAˆÉ’O‘sˆê˜YAˆÀ•—´‘¾˜NA”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚É‚æ‚é‹à‘®ƒiƒmƒ`ƒƒƒlƒ‹‚Ì’ïR§Œä«‚ÌŒüã‚ÉŠÖ‚·‚錤‹†h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-5A2010”Nt‹GA_“Þì

 

ˆÉ’O‘sˆê˜YA—F“c—I‰îAˆÀ•—´‘¾˜YAŒú•ê‘§A”’Š~~ˆê

g•ªŠ„Œ^“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚éNiƒiƒmƒ`ƒƒƒlƒ‹‚ÌŽ¥‹C’ïR“Á«§Œäh

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-6A2010”Nt‹GA_“Þì

 

ŒKŒ´—m‰îA¼‘ºM–çAˆÉ’O‘sˆê˜YAŒÃàVˆŸ”üA”’Š~~ˆê

gŒõŠwŒ°”÷‹¾‚»‚ÌêŠÏŽ@‚É‚æ‚é‹à‘®×üƒ`ƒƒƒlƒ‹‚ł̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-7A2010”Nt‹GA_“Þì

 

ŒKŒ´—m‰îA¼‘ºM–çAˆÉ’O‘sˆê˜YAŒÃàVˆŸ”üA”’Š~~ˆê

gCCD‹ßÔŠOƒCƒ[ƒWƒ“ƒO‚É‚æ‚é‹à‘®×ü‚̉·“x‘ª’è‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-8A2010”Nt‹GA_“Þì

 

‘ê’J˜a‘A—F“c—I‰îA‹v•Äœ\Aã–ìr‰îA‰Ô“c“¹—fA“n糌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚¨‚¯‚éV‚½‚È’Ê“dŽè–@‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-9A2010”Nt‹GA_“Þì

 

‰Ô“c“¹—fA—F“c—I‰îA‹v•Äœ\Aã–ìr‰îA‘ê’J˜a‘A”’Š~~ˆê

gƒpƒbƒVƒx[ƒVƒ‡ƒ“ˆ—‚ðŽ{‚µ‚½ƒiƒmƒMƒƒƒbƒv“d‹É‚É‚¨‚¯‚é“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é“Á«§Œä‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-10A2010”Nt‹GA_“Þì

 

‹v•Äœ\A—F“c—I‰îA‰Ô“c“¹—fAã–ìr‰îA‘ê’J˜a‘A”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚è컂µ‚½’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì“Á«§Œäh

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-11A2010”Nt‹GA_“Þì

 

ã–ìr‰îA—F“c—I‰îA‹v•Äœ\A‘ê’J˜a‘A‰Ô“c“¹—fA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚ÌWω»‚ÌŒŸ“¢h

‘æ57‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA19a-P10-12A2010”Nt‹GA_“Þì

 

ã–ìr‰îA—F“c—I‰îA‹v•Äœ\A‘ê’J˜a‘A“n糌h“oA”’Š~~ˆê i“dŽqî•ñ’ÊMŠw‰ïƒGƒŒƒNƒgƒƒjƒNƒXƒ\ƒTƒCƒGƒeƒB •½¬22”N“dŽqƒfƒoƒCƒXŒ¤‹†‰ï ˜_•¶”­•\§—ãÜj

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚ÌWω»h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2010”N2ŒŽ22“ú-23“úA‰«“ê

 

‘ê’J˜a‘A—F“c—I‰îA“n糌h“oA‹v•Äœ\Aã–ìr‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚É‚æ‚éƒvƒŒƒi[Œ^‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2010”N2ŒŽ22“ú-23“úA‰«“ê

 

‘¾“cŠ¸sABernard GELLOZA—F“c—I‰îA¼‘ºM–çA”’Š~~ˆêA‰z“cM‹`

gƒVƒŠƒRƒ“ƒiƒm\‘¢‚Ì“dŽq‹@”\h

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æŽl‰ñ¬‰Ê•ñ‰ïAP106A2010”N1ŒŽ19“ú-20“úA“Œ‹ž

 

Y. Tomoda, T. Watanabe, M. Hanada, W. Kume, S. Itami and J. Shirakashi (Selected for the Poster Award of the Symposium)

"Magnetoresistance Properties of Planar-Type Ferromagnetic Tunnel Junctions Fabricated by Field-Emission-Induced Electromigration"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ6‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT76A2009”N12ŒŽ5“úA“Œ‹ž”_H‘åŠw

 

S. Nishimura, Y. Eto, T. Toyofuku, Y. Kuwabara and J. Shirakashi

"Control of Tunnel Resistance of Si Nanogaps Using Field-Emission-Induced Electromigration"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ6‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAT78A2009”N12ŒŽ5“úA“Œ‹ž”_H‘åŠw

 

—F“c—I‰îA“n粌h“oA‰Ô“c“¹—fA‹v•Äœ\AˆÉ’O‘sˆê˜YA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚è컂µ‚½‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‚É‚¨‚¯‚鎥‹C’ïR“Á«h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZD-24A2009”NH‹GA•xŽR

 

‹{‰º˜a–çA¼‘ºM–çA–L•Ÿ‹MŽmAŒKŒ´—m‰îAA. A. TsengA”’Š~~ˆê

g‘å‹C’†Žº‰·‰º‚Å‚ÌSPMƒXƒNƒ‰ƒbƒ`‰ÁH‚É‚æ‚é—ÊŽq‰»ƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‚Ì”­Œ»‚ƧŒäh

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-1A2009”NH‹GA•xŽR

 

ˆÀ•—´‘¾˜NAˆÉ’O‘sˆê˜YA—F“c—I‰îA”’Š~~ˆê

g“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚É‚¨‚¯‚éƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“ƒƒJƒjƒYƒ€‚ÌŒŸ“¢h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-2A2009”NH‹GA•xŽR

 

ˆÉ’O‘sˆê˜YA—F“c—I‰îAˆÀ•—´‘¾˜NA”’Š~~ˆê

g“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚É‚¨‚¯‚éƒ`ƒƒƒlƒ‹Œ`ó‹·ó‰ß’ö‚ÌŒŸ“¢h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-3A2009”NH‹GA•xŽR

 

‘ê’J˜a‘A—F“c—I‰îA‹v•Äœ\A‰Ô“c“¹—fA“n粌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éƒiƒmƒXƒP[ƒ‹ƒfƒoƒCƒX‚Ìì»(1): ’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚ÌŒŸ“¢h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-4A2009”NH‹GA•xŽR

 

“n糌h“oA—F“c—I‰îA‰Ô“c“¹—fA‹v•Äœ\AˆÉ’O‘sˆê˜YA‘ê’J˜a‘A”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éƒiƒmƒXƒP[ƒ‹ƒfƒoƒCƒX‚Ìì»(2): ‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‚ÌŒŸ“¢h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-5A2009”NH‹GA•xŽR

 

ã–ìr‰îA—F“c—I‰îA‹v•Äœ\A‰Ô“c“¹—fA“n糌h“oA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚é‹­Ž¥«ƒgƒ“ƒlƒ‹Ú‡‚ÌWω»‹Zp‚ÌŒŸ“¢h

‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA10a-ZH-6A2009”NH‹GA•xŽR

 

”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“Žè–@‚É‚æ‚éƒiƒmƒMƒƒƒbƒv‚ÌŒ`¬‚ƃiƒmƒfƒoƒCƒX‚Ì컧Œäi30•ªjh

ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒmƒMƒƒƒbƒv‚Ì컂Ƃ»‚̃fƒoƒCƒX‰ž—p|ƒiƒmƒMƒƒƒbƒv‚ð—p‚¢‚½ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒXƒfƒoƒCƒX‚ÉŒü‚¯‚Ä|v

9ŒŽ9“ú13:00`17:30A‘æ70‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA9p-ZG-4A2009”NH‹GA•xŽR

 

¼‘ºM–çA—F“c—I‰îA”’Š~~ˆêA‰z“cM‹`

g”¼“±‘ÌE‹­Ž¥«‘̂ւ̃iƒmƒXƒP[ƒ‹‰ÁH‚ƃfƒoƒCƒX‰ž—ph

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æ˜Z‰ñ‘S‘̉ï‹cAP106A2009”N8ŒŽ6“ú-7“úA–¼ŒÃ‰®

 

¼‘ºM–çAŒÃàVˆŸ”üA”’Š~~ˆê

"Research Activities on NanoelectronicsA Nanofabrication and Nanolithography"

—«–¢—ˆˆç¬‹@\u—Žq’†‚¶‚Ì‚½‚߂̃Tƒ}[ƒXƒN[ƒ‹2009@”_‚ÆH‚ðˆê“ú‚Ń_ƒuƒ‹‘ÌŒ± in ”_H‘åv@”’Š~Œ¤‹†Žºƒ|ƒXƒ^[Љî

2009”N8ŒŽ1“úA“Œ‹ž”_H‘åŠw

 

2008”N“x (FY 2008)

—F“c—I‰îA‚‹´‰À—SA‰Ô“c“¹—fA‹v•Äœ\AˆÉ’O‘sˆê˜YA“n粌h“oA”’Š~~ˆê

gƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é‹­Ž¥«ƒiƒmƒMƒƒƒbƒv‚Ì컂Ǝ¥‹C’ïR“Á«h

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA31a-L-9A2009”Nt‹GAˆïé

 

‰Ô“c“¹—fA—F“c—I‰îA‹v•Äœ\Aã–ìr‰îA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚è컂³‚ꂽƒiƒmƒMƒƒƒbƒv‚ÌŒŸ“¢h

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-1A2009”Nt‹GAˆïé

 

‹v•Äœ\A—F“c—I‰îAã–ìr‰îA‰Ô“c“¹—fA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚ł̃iƒmƒMƒƒƒbƒv“d‹É‚Ì“Á«§Œä‚É‚¨‚¯‚é“dˆ³‘‰Á•‚ÌŒŸ“¢h

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-2A2009”Nt‹GAˆïé

 

ã–ìr‰îA‹v•Äœ\A‰Ô“c“¹—fA—F“c—I‰îA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚ð—p‚¢‚½ƒiƒmƒMƒƒƒbƒv“d‹É‚Ì“¯Žž“Á«§Œä‚ÌŒŸ“¢h

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-3A2009”Nt‹GAˆïé

 

]“¡—S”nA¼‘ºM–çA‰Ô“c“¹—fA–L•Ÿ‹MŽmA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚É‚æ‚éSiŒnƒiƒmƒMƒƒƒbƒv‚̃gƒ“ƒlƒ‹’ïR§Œäh

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-4A2009”Nt‹GAˆïé

 

ˆÉ’O‘sˆê˜YA‚‹´‰À—SA—F“c—I‰îAˆÀ•—´‘¾˜YA”’Š~~ˆê

g“dˆ³ƒtƒB[ƒhƒoƒbƒNEM‚Å‚Ì’ïR§Œä“Á«‚ɑ΂·‚é“dˆ³§Œäƒpƒ‰ƒ[ƒ^‚ÌŒø‰Êh

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-5A2009”Nt‹GAˆïé

 

ŒKŒ´—m‰îA‹{‰º˜a–çA‚‹´‰À—SAˆÉ’O‘sˆê˜YA”’Š~~ˆê

gŒõŠwŒ°”÷‹¾‰º‚É‚¨‚¯‚éƒÊm‹‰‹à‘®×üƒ`ƒƒƒlƒ‹‚Ì“dˆ³§ŒäŒ^EM‚»‚ÌêŠÏŽ@h

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-6A2009”Nt‹GAˆïé

 

‹{‰º˜a–çAŒKŒ´—m‰îA‚‹´‰À—SA¼‘ºM–çA–L•Ÿ‹MŽmA”’Š~~ˆê

g‹à‘®×üƒ`ƒƒƒlƒ‹‚ɑ΂·‚éSPMƒXƒNƒ‰ƒbƒ`‰ÁH‚Ì‚»‚ÌêƒRƒ“ƒ_ƒNƒ^ƒ“ƒX‘ª’èh

‘æ56‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA1p-ZQ-7A2009”Nt‹GAˆïé

 

—F“c—I‰îA”’Š~~ˆê

gƒvƒŒƒi[Œ^‹­Ž¥«ƒiƒm\‘¢‚É‚¨‚¯‚éƒiƒmƒMƒƒƒbƒv‚Ì컂Ǝ¥‹C’ïR“Á«h

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v‡hƒRƒƒLƒ…[ƒ€iŒ¤C‰ïjA2009”N3ŒŽ7“ú-8“úAƒzƒeƒ‹ ƒGƒo[ƒOƒŠ[ƒ“•xŽm

 

¼‘ºM–çA”’Š~~ˆê

g10-nm ƒXƒP[ƒ‹SPMƒŠƒ\ƒOƒ‰ƒtƒB[‹Zph

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v‡hƒRƒƒLƒ…[ƒ€iŒ¤C‰ïjA2009”N3ŒŽ7“ú-8“úAƒzƒeƒ‹ ƒGƒo[ƒOƒŠ[ƒ“•xŽm

 

ã–ìr‰îA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚ð—p‚¢‚½ƒiƒmƒMƒƒƒbƒv“d‹É‚Ì“Á«§Œä‚ÉŠÖ‚·‚錤‹†h

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v‡hƒRƒƒLƒ…[ƒ€iŒ¤C‰ïjA2009”N3ŒŽ7“ú-8“úAƒzƒeƒ‹ ƒGƒo[ƒOƒŠ[ƒ“•xŽm

 

ŒKŒ´—m‰îA”’Š~~ˆê

gƒvƒŒƒi[Œ^ƒiƒmƒfƒoƒCƒX컂̂½‚ß‚ÌŒõŠwŒ°”÷‹¾‚»‚ÌêŠÏŽ@‹Zp‚ÌŠJ”­h

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v‡hƒRƒƒLƒ…[ƒ€iŒ¤C‰ïjA2009”N3ŒŽ7“ú-8“úAƒzƒeƒ‹ ƒGƒo[ƒOƒŠ[ƒ“•xŽm

 

—F“c—I‰îA‹v•Äœ\A‰Ô“c“¹—fA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“–@‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ìì»h

“dŽqî•ñ’ÊMŠw‰ï “dŽqƒfƒoƒCƒXŒ¤‹†‰ïiEDj/ƒVƒŠƒRƒ“Þ—¿EƒfƒoƒCƒXŒ¤‹†‰ïiSDMju‹@”\ƒiƒmƒfƒoƒCƒX‚¨‚æ‚ÑŠÖ˜A‹ZpvA2009”N 2ŒŽ26“ú-27“úA–kŠC“¹

 

—F“c—I‰îA¼‘ºM–çA”’Š~~ˆêA‰z“cM‹`

g”¼“±‘ÌE‹­Ž¥«‘̂ւ̃iƒmƒXƒP[ƒ‹‰ÁH‚ƃfƒoƒCƒX‰ž—ph

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æŽO‰ñ¬‰Ê•ñ‰ïAP107A2009”N1ŒŽ28“ú-29“úA“Œ‹ž

 

S. Nishimura, T. Toyofuku and J. Shirakashi

"Improvement of SPM Local Oxidation Nanolithography on Size Controllability of Si Oxide Wires"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ5‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAP40A2008”N12ŒŽ13“úA“d‹C’ÊM‘åŠw

 

T. Toyofuku, S. Nishimura and J. Shirakashi

"10 Micrometer-Scale Local Oxidation Method Using Scanning Probe Microscopy"

“Œ‹ž”_H‘åŠwE“d‹C’ÊM‘åŠw ‘æ5‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒiƒm–¢—ˆÞ—¿‚ƃRƒq[ƒŒƒ“ƒgŒõ‰ÈŠwvAP41A2008”N12ŒŽ13“úA“d‹C’ÊM‘åŠw

 

¼‘ºM–çA]“¡—S”nA‹{‰º˜a–çA–L•Ÿ‹MŽmA”’Š~~ˆê

gSPMƒŠƒ\ƒOƒ‰ƒtƒB[‚É‚æ‚éƒvƒŒƒi[Œ^SiƒfƒoƒCƒX‚Ì“d‹C“Á«§Œäh

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-2A2008”NH‹GAˆ¤’m

 

‹{‰º˜a–çA¼‘ºM–çA–L•Ÿ‹MŽmA”’Š~~ˆê

g“dˆ³§ŒäŒ^SPMƒXƒNƒ‰ƒbƒ`ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[h

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-3A2008”NH‹GAˆ¤’m

 

‚‹´‰À—SAˆÉ’O‘sˆê˜YA—F“c—I‰îA”’Š~~ˆê

g“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚¨‚¯‚駌äƒpƒ‰ƒ[ƒ^‚ÌŒŸ“¢h

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-4A2008”NH‹GAˆ¤’m

 

‰Ô“c“¹—fA—F“c—I‰îA‹v•Äœ\A‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^EM‚ð—p‚¢‚½ƒiƒmƒMƒƒƒbƒv“d‹É‚Ì“Á«§Œä‚É‚¨‚¯‚é“d‹ÉŒ`ó‚ÌŒŸ“¢h

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-5A2008”NH‹GAˆ¤’m

 

‹v•Äœ\A—F“c—I‰îA‰Ô“c“¹—fA‚‹´‰À—SA”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^ì»ðŒ‚ÌŒŸ“¢h

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-6A2008”NH‹GAˆ¤’m

 

—F“c—I‰îA‚‹´‰À—SA‰Ô“c“¹—fA‹v•Äœ\AˆÉ’O‘sˆê˜YA”’Š~~ˆê

gƒvƒŒƒi[Œ^‹­Ž¥«ƒiƒm\‘¢‚É‚¨‚¯‚éƒiƒmƒMƒƒƒbƒv‚Ì컂Ǝ¥‹C’ïR“Á«h

‘æ69‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA4a-H-7A2008”NH‹GAˆ¤’m

 

—F“c—I‰îA¼‘ºM–çA”’Š~~ˆêA‰z“cM‹`

g”¼“±‘ÌE‹­Ž¥«‘̂ւ̃iƒm‰ÁH‹Zp‚ÌŠJ”­‚ƃiƒmƒfƒoƒCƒX컂ւ̓K—ph

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æŽl‰ñ‘S‘̉ï‹cAP106A2008”N8ŒŽ7“ú-8“úA–¼ŒÃ‰®

 

ƒ`ƒƒƒ“ ƒLƒ‡ƒ“ƒ~ƒ“A‚‹´˜a‘åAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

gSPMƒXƒNƒ‰ƒbƒ`ƒiƒm‰ÁH‚É‚æ‚é‹­Ž¥«×ü‚Ì‹·ó‰»h

•½¬20”N“d‹CŠw‰ïAŠî‘bEÞ—¿E‹¤’Ê•”–å‘å‰ïA2008”N8ŒŽAç—t

 

›ÀG‹³Ai“¡—»•½AŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

gSPM‹ÇŠŽ_‰»‚É‚¨‚¯‚锽‰ž“d—¬‚Ì’Tj|ŽŽ—¿ŠÔ‹——£ˆË‘¶h

•½¬20”N“d‹CŠw‰ïAŠî‘bEÞ—¿E‹¤’Ê•”–å‘å‰ïA2008”N8ŒŽAç—t

 

’|‘º‘׎iA”’Š~~ˆê

gSPM ƒŠƒ\ƒOƒ‰ƒtƒB‚É‚æ‚è컂µ‚½Ž¥«ƒiƒm\‘¢‚Ì•]‰¿h

“d‹CŠw‰ïƒ}ƒOƒlƒeƒBƒbƒNƒXŒ¤‹†‰ïA2008”N8ŒŽ4“úA‹{é

 

–L•Ÿ‹MŽmA¼‘ºM–çA‹{‰º˜a–çA”’Š~~ˆê

gƒ}ƒ‹ƒ`ƒXƒP[ƒ‹SPMƒŠƒ\ƒOƒ‰ƒtƒB[h

ƒGƒXƒAƒCƒAƒCEƒiƒmƒeƒNƒmƒƒW[ŽåÃ@‘–¸Œ^ƒvƒ[ƒuŒ°”÷‹¾ƒZƒ~ƒi[2008`Œv‘ª¸“x‚Ì’Ç‹y‚ƃiƒm•\–Ê•¨«‚Ö‚Ì“WŠJ`

2008”N7ŒŽ18“úA“Œ‹ž

 

2007”N“x (FY 2007)

¼‘ºM–çA–L•Ÿ‹MŽmA‹{‰º˜a–çA’|‘º‘׎iA”’Š~~ˆê

gSPM‹ÇŠŽ_‰»ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[‚Ì‚¸“x‰»h

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-7A2008”Nt‹GAç—t

 

–L•Ÿ‹MŽmA¼‘ºM–çA‰¬–ì‘ñŠCA‹{‰º˜a–çA”’Š~~ˆê

g10 ƒÊm‹‰SPM‹ÇŠŽ_‰»ƒŠƒ\ƒOƒ‰ƒtƒB[h

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-8A2008”Nt‹GAç—t

 

‹{‰º˜a–çA‰¬–ì‘ñŠCA¼‘ºM–çA”’Š~~ˆê

g‹­Ž¥«‹à‘®‚ɑ΂·‚éSPMƒXƒNƒ‰ƒbƒ`ƒŠƒ\ƒOƒ‰ƒtƒB[‚Ì“K—ph

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-9A2008”Nt‹GAç—t

 

‚‹´‰À—SAŠž“ˆËA–{ŽRŠî²AˆÉ’O‘sˆê˜YA”’Š~~ˆê

g“dˆ³ƒtƒB[ƒhƒoƒbƒNƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é‹à‘®×üƒ`ƒƒƒlƒ‹‚Ì’ïR§Œäh

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-10A2008”Nt‹GAç—t

 

Šž“ˆËA‚‹´‰À—SA–{ŽRŠî²A”’Š~~ˆê

g“dŠE•úŽË“d—¬—U‹NŒ^ƒGƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é’P“dŽqƒgƒ‰ƒ“ƒWƒXƒ^‚Ì컂Ƃ»‚Ì“®ì“Á«h

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-11A2008”Nt‹GAç—t

 

i“¡—»•½A›¸“c‘×”VAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

gAFM‹ÇŠŽ_‰»‚É‚¨‚¯‚锽‰ž“d—¬‚̃Jƒ“ƒ`ƒŒƒo[‚½‚í‚ݗʈˑ¶h

‘æ55‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA27a-ZS-6A2008”Nt‹GAç—t

 

Y. Tomoda, S. Kayashima, M. Motoyama, K. Takahashi and J. Shirakashi

"Magnetoresistance Properties of Planar-Type Ferromagnetic Nanostructures"

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v@ƒiƒm–¢—ˆ‰ÈŠwŒ¤‹†‹’“_2007”N“xƒRƒƒLƒ…[ƒ€AP18A2008”N3ŒŽ8“úA“Œ‹ž”_H‘åŠw

 

S. Nishimura, T. Ogino and J. Shirakashi

"Multiscale SPM Lithography"

•¶•”‰ÈŠwÈ‘åŠw‰@‹³ˆç‰üŠvŽx‰‡ƒvƒƒOƒ‰ƒ€u‰ÈŠw—§‘lވ笃vƒƒOƒ‰ƒ€v@ƒiƒm–¢—ˆ‰ÈŠwŒ¤‹†‹’“_2007”N“xƒRƒƒLƒ…[ƒ€AP19A2008”N3ŒŽ8“úA“Œ‹ž”_H‘åŠw

 

¼‘ºM–çA—F“c—I‰îA”’Š~~ˆêA‰z“cM‹`

gƒVƒŠƒRƒ“‚Ö‚ÌSPM”÷׉ÁH‹Zph

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æ“ñ‰ñ¬‰Ê•ñ‰ïAP107A2008”N3ŒŽ7“ú-8“úA“Œ‹ž

 

—F“c—I‰îA¼‘ºM–çA”’Š~~ˆêA‰z“cM‹`

g‹­Ž¥«ƒiƒm\‘¢‚Å‚ÌŽ¥‹C“Á«§Œäh

‰ÈŠwŒ¤‹†”ï•â•‹à“Á’è—̈挤‹† uƒVƒŠƒRƒ“ƒiƒmƒGƒŒƒNƒgƒƒjƒNƒX‚ÌV“WŠJ@\ƒ|ƒXƒgƒXƒP[ƒŠƒ“ƒOƒeƒNƒmƒƒW[\v@‘æ“ñ‰ñ¬‰Ê•ñ‰ïAP108A2008”N3ŒŽ7“ú-8“úA“Œ‹ž

 

Y. Tomoda, S. Kayashima, M. Motoyama, K. Takahashi and J. Shirakashi

"Magnetoresistance Effect of Planar-Type Ferromagnetic Nanostructures"

“d‹C’ÊM‘åŠwE“Œ‹ž”_H‘åŠw ‘æ4‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒRƒq[ƒŒƒ“ƒgŒõ‰ÈŠw‚ƃiƒm–¢—ˆÞ—¿vAP83A2007”N12ŒŽ1“úA“Œ‹ž”_H‘åŠw

 

S. Nishimura, T. Ogino and J. Shirakashi

"SPM Lithography on Micro- and Nano-Scales"

“d‹C’ÊM‘åŠwE“Œ‹ž”_H‘åŠw ‘æ4‰ñ‡“¯ƒVƒ“ƒ|ƒWƒEƒ€uƒRƒq[ƒŒƒ“ƒgŒõ‰ÈŠw‚ƃiƒm–¢—ˆÞ—¿vAP84A2007”N12ŒŽ1“úA“Œ‹ž”_H‘åŠw

 

¼‘ºM–çA‰¬–ì‘ñŠCA’|‘º‘׎iA”’Š~~ˆê

gSPM‹ÇŠŽ_‰»ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[‚É‚¨‚¯‚éŽ_‰»”½‰žƒ‚ƒfƒ‹‚ÌŒŸ“¢h

‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-4A2007”NH‹GA–kŠC“¹

 

¼‘ºM–çA‰¬–ì‘ñŠCA’|‘º‘׎iA”’Š~~ˆê

gSPM‹ÇŠŽ_‰»–@‚É‚¨‚¯‚éSiŽ_‰»•¨×üƒTƒCƒY‚ÌQ’lˆË‘¶«h

‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-5A2007”NH‹GA–kŠC“¹

 

‰¬–ì‘ñŠCA¼‘ºM–çA”’Š~~ˆê

gSPM‹ÇŠ–€ŽCê‚É‚æ‚éSiƒXƒNƒ‰ƒbƒ`ƒŠƒ\ƒOƒ‰ƒtƒB[‚Å‚Ì’Tj‘–¸ðŒ‚ÌŒŸ“¢h

‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-6A2007”NH‹GA–kŠC“¹

 

Šž“ˆËA‚‹´‰À—SA–{ŽRŠî²A”’Š~~ˆê

g‹­Ž¥«ƒiƒmƒMƒƒƒbƒv“d‹É‚̃GƒŒƒNƒgƒƒ}ƒCƒOƒŒ[ƒVƒ‡ƒ“‚É‚æ‚é“Á«§Œäh

‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-7A2007”NH‹GA–kŠC“¹

 

‚‹´‰À—SAŠž“ˆËA–{ŽRŠî²A”’Š~~ˆê

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‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-8A2007”NH‹GA–kŠC“¹

 

‚‹´‰À—SAŠž“ˆËA–{ŽRŠî²A”’Š~~ˆê

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‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-9A2007”NH‹GA–kŠC“¹

 

›¸“c‘×”VAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

gNiFe”––Œ‚ÌSPM—z‹ÉŽ_‰»`”¼“±‘ÌŽŽ—¿‚Æ‚Ì·ˆÙh

‘æ68‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA7a-P14-3A2007”NH‹GA–kŠC“¹

 

’·’Jìr—SAŽR“c²ŒåA΋´’õŽjAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

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‘æ31‰ñ“ú–{‰ž—pŽ¥‹CŠw‰ï Šwpu‰‰‰ïA11aC-10A2007”N9ŒŽ11“ú-14“úA“Œ‹ž

 

΋´’õŽjA’·’Jìr—SAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

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“d‹CŠw‰ïƒ}ƒOƒlƒeƒBƒbƒNƒXŒ¤‹†‰ïA2007”N7ŒŽ24“úAŽOd

 

¼‘ºM–çA‰¬–ì‘ñŠCA”’Š~~ˆê

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2007”N7ŒŽ12“úA“Œ‹ž

 

΋´’õŽjA›¸“c‘×”VAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

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2007”N7ŒŽ12“úA“Œ‹ž

 

’|‘º‘׎iA”’Š~~ˆê

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2006”N“x (FY 2006)

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g“®“I’Tj§ŒäŽè–@‚É‚æ‚éSPM‹ÇŠŽ_‰»ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[h

‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-3A2007”Nt‹GA_“Þì

 

‹g“cŒ’Ž¡A¼‘ºM–çA‰¬–ì‘ñŠCA’|‘º‘׎iA”’Š~~ˆê

gSPM‹ÇŠŽ_‰»–@‚É‚æ‚é10nmˆÈ‰º‹‰SiŽ_‰»•¨×ü‚Ìì»h

‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-4A2007”Nt‹GA_“Þì

 

“y‰®’m‘åA¼‘ºM–çA‰¬–ì‘ñŠCA”’Š~~ˆê

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‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-5A2007”Nt‹GA_“Þì

 

Šž“ˆËA‚‹´‰À—SA–{ŽRŠî²A”’Š~~ˆê

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‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-6A2007”Nt‹GA_“Þì

 

‰¬–ì‘ñŠCA¼‘ºM–çA—F“c—I‰îA”’Š~~ˆê

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‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-7A2007”Nt‹GA_“Þì

 

›¸“c‘×”VA“n•ÓŒ¹‘¾AŽR“c@“wA”’Š~~ˆêA’|‘º‘׎i

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‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29p-S-2A2007”Nt‹GA_“Þì

 

‰¡ŽR’B•FAŽÄ“c‘åŽ÷AΈä‹OsAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

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‘æ54‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA29a-ZT-7A2007”Nt‹GA_“Þì

 

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›¸“c‘×”VA“n糌¹‘¾AŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

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‘æ30‰ñ“ú–{‰ž—pŽ¥‹CŠw‰ï Šwpu‰‰‰ïA11aD-12A2006”N9ŒŽ11“ú-14“úA“‡ª

 

’·’Jìr—SA›¸“c‘×”VAŽR“c“wA”’Š~~ˆêA’|‘º‘׎i

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¼‘ºM–çA—F“c—I‰îA”’Š~~ˆê

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2005”N“x (FY 2005)

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‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-G-13A2006”Nt‹GA“Œ‹ž

 

Ä“¡~ŽjAŽÄ“c‹`‘åA¼‘ºM–çA”’Š~~ˆêA’|‘º‘׎i

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‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-G-12A2006”Nt‹GA“Œ‹ž

 

›¸“c‘×”VA“n糌¹‘¾AŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

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‘æ53‰ñ‰ž—p•¨—ŠwŠÖŒW˜A‡u‰‰‰ïA24p-G-11A2006”Nt‹GA“Œ‹ž

 

ŽÄ“c‹`‘åA—F“c—I‰îA”’Š~~ˆêA’|‘º‘׎i

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‘æ29‰ñ“ú–{‰ž—pŽ¥‹CŠw‰ï Šwpu‰‰‰ïA20p-D-4A2005”N9ŒŽ19“ú-22“úA’·–ì

 

—F“c—I‰îAŽÄ“c‹`‘åA”’Š~~ˆêA’|‘º‘׎i

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‘æ29‰ñ“ú–{‰ž—pŽ¥‹CŠw‰ï Šwpu‰‰‰ïA22p-F-11A2005”N9ŒŽ19“ú-22“úA’·–ì

 

“n糌¹‘¾A‘D‰z®ŽjAŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

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‘æ29‰ñ“ú–{‰ž—pŽ¥‹CŠw‰ï Šwpu‰‰‰ïA22a-D-7A2005”N9ŒŽ19“ú-22“úA’·–ì

 

“n糌¹‘¾A‘D‰z®ŽjAŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

g≑Ì/Ž¥«‹à‘®Ï‘w–Œ‚ÌAFM‹ÇŠŽ_‰»“d—¬‘ª’èh

‘æ66‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ïA8p-ZL-1A2005”NH‹GA“¿“‡

 

’·’Jìr—SA“n糌¹‘¾AŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

g•\–Ê‚ð‰ÁH‚µ‚½NiFe×ü\‘¢‚ÌŽ¥‹C’ïRŒø‰Êh

•½¬17”N“d‹CŠw‰ï Šî‘bEÞ—¿E‹¤’Ê•”–å‘å‰ïAP-21A2005”NA“Œ‹ž

 

›¸“c‘×”VA“n糌¹‘¾A‘D‰z®ŽjAŽR“c“wA’|‘º‘׎iA”’Š~~ˆê

gŒ´ŽqŠÔ—ÍŒ°”÷‹¾‚ð—p‚¢‚½ƒiƒmŽ_‰»‰ÁH‚Æ”½‰ž“d—¬‚Ì‘ª’èh

•½¬17”N“d‹CŠw‰ï Šî‘bEÞ—¿E‹¤’Ê•”–å‘å‰ïA8-1A2005”NA“Œ‹ž

 

”’Š~~ˆê

g‹­Ž¥«‘Ì‚Ö‚ÌSPM‹ÇŠŽ_‰»ƒiƒmƒŠƒ\ƒOƒ‰ƒtƒB[‚Æ“d‹C“Á«•]‰¿h

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2005”N6ŒŽ17“úA“Œ‹ž

2005”N6ŒŽ24“úA‘åã


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